Fast in-line surface topography metrology enabling stress calculation for solar cell manufacturing for throughput in excess of 2000 wafers per hour von Walecki, W J, Szondy, F, Hilali, M M

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Characterization of the polarization state of weak ultrashort coherent signals by dual-channel spectral interferometry von Walecki, W J, Fittinghoff, D N, Smirl, A L, Trebino, R

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OP03.03: The value of ultrasound and MRI in fetal anomalies diagnosis von Monika Bekesiñska Figatowska, M. B. F., Jerzy Walecki, J. W., Jerzy Waclaw Zwoliñski, J. W. Z., Renata Jaczyñska, R. J., Ceran Alicja, A. C.

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Band offsets and exciton confinement in Zn1-yCdySe/Zn1-xMnxSe quantum wells von WAŁECKI, W. J, NURMIKKO, A. V, SAMARTH, N, LUO, H, FURDYNA, J. K, OTSUKA, N

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Growth and properties of new wide-gap quantum well structures : Zn1-xMnxSe/Zn1-yCdySe von SAMARTH, N, LUO, H, BUSCHERT, J, FURDYNA, J. K, WALECKI, W. J, NURMIKKO, A. V, ALONSO, R. G, EUN-SOON OH, RAMDAS, A. K, OTSUKA, N

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Dynamics of the Amplitude, Phase and Polarization State of Coherent Emission from Quantum Wells von Smirl, A. L., Walecki, W. J., Chen, Xiayuan, Buccafusca, O.

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Terahertz electromagnetic transients as probes of a two-dimensional electron gas von Walecki, W.J., Some, D., Kozlov, V.G., Nurmikko, A.V.

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Characteristics of thin-film ZnSe/(Zn,Cd)Se/ZnSe heterostructure waveguides in the visible and near infrared von WALECKI, W. J, NURMIKKO, A. V, SAMARTH, N, LUO, H, FURDYNA, J. K

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Novel noncontact thickness metrology for backend manufacturing of wide bandgap light emitting devices von Walecki, Wojtek J., Lai, Kevin, Souchkov, Vitalij, Van, Phuc, Lau, SH, Koo, Ann

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Measurement of the ultrafast polarization dynamics of weak four-wave mixing signals by dual-channel femtosecond spectral interferometry von Buccafusca, O., Chen, X., Walecki, Wojciech J., Smirl, Arthur L.

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Terahertz electromagnetic transients as probes of a two-dimensional electron gas von Walecki, W. J., Some, D., Kozlov, V. G., Nurmikko, A. V.

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Terahertz electomagnetic transients as probes of a two-dimensional electron gas von WALECKI, W. J, SOME, D, KOZLOV, V. G, NURMIKKO, A. V

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Complete Temporal Characterization of the Polarization State of Weak Ultrashort Signals von Walecki, W. J., Smirl, A. L., Fittinghoff, D. K., Trebino, R.

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Temporally and spectrally resolved amplitude and phase of coherent four-wave-mixing emission from GaAs quantum wells von Chen, X., Walecki, Wojciech J., Buccafusca, O., Fittinghoff, David N., Smirl, Arthur L.

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Patent Reviews: 6,666,511; 6,667,808; 6,671,044; 6,671,050; 6,671,106; 6,674,519; 6,674,530; 6,690,474 von Brunsting, A., Amirkhanian, V. D., Cohn, G. E., Daniels, S., Decker, J. A., Fisher, D. S., Gaynor, E. S., Hilliard, R. L., Horwitz, B. A., Lee, K. K., Lee, W.-H., Loewen, E. G., Masters, B. R., Miranda, H. A., Mitchell, G. L., Parretta, A., Rich, D. C., Schall, H. B., Simpson, M. J., Tseng, S.-M., Walczak, A., Walecki, W. J., Zhao, H.

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Patent Reviews: 6,639,674; 6,650,403; 6,654,184; 6,661,577; 6,674,528; 6,678,045; 6,690,024 von Brunsting, A., Amirkhanian, V. D., Cohn, G. E., Daniels, S., Decker, J. A., Fisher, D. S., Gaynor, E. S., Hilliard, R. L., Horwitz, B. A., Lee, K. K., Lee, W.-H., Loewen, E. G., Masters, B. R., Miranda, H. A., Mitchell, G. L., Parretta, A., Rich, D. C., Schall, H. B., Simpson, M. J., Tseng, S.-M., Walczak, A., Walecki, W. J., Zhao, H.

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Patent Reviews: 6,636,300; 6,646,743; 6,650,416; 6,650,425; 6,654,125; 6,661,574; 6,665,486 von Brunsting, A., Amirkhanian, V. D., Cohn, G. E., Daniels, S., Decker, J. A., Fisher, D. S., Gaynor, E. S., Hilliard, R. L., Horwitz, B. A., Lee, K. K., Lee, W.-H., Loewen, E. G., Masters, B. R., Miranda, H. A., Mitchell, G. L., Parretta, A., Rich, D. C., Schall, H. B., Simpson, M. J., Tseng, S.-M., Walczak, A., Walecki, W. J., Webb, R. H., Zhao, H.

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Patent Reviews: 6,570,648 B1; 6,576,905 B2; 6,587,214 B1; 6,597,462 B2; 6,603,126 B2; 6,603,561 B2; 6,606,150 B2; 6,608,689 B1; 6,610,990; 6,624,884; 6,624,888 B2; 6,630,999; 6,633... von Brunsting, A., Amirkhanian, V. D., Cohn, G. E., Daniels, S., Decker, J. A., Fisher, D. S., Gaynor, E. S., Hilliard, R. L., Horwitz, B. A., Lee, K. K., Lee, W.-H., Loewen, E. G., Masters, B. R., Miranda, H. A., Mitchell, G. L., Parretta, A., Rich, D. C., Schall, H. B., Simpson, M. J., Tseng, S.-M., Walczak, A., Walecki, W. J., Zhao, H.

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Patent Reviews: 6,522,403; 6,570,657; 6,573,998; 6,580,503; 6,580,506; 6,580,510; 6,580,560; 6,580,567; 6,580,571; 6,580,849; 6,587,198; 6,590,669; 6,608,721; 6,621,580; 6,636,317 von Brunsting, A., Amirkhanian, V. D., Cohn, G. E., Daniels, S., Decker, J. A., Fisher, D. S., Gaynor, E. S., Hilliard, R. L., Horwitz, B. A., Lee, K. K., Lee, W.-H., Loewen, E. G., Masters, B. R., Miranda, H. A., Mitchell, G. L., Parretta, A., Rich, D. C., Schall, H. B., Simpson, M. J., Tseng, S.-M., Walczak, A., Walecki, W. J., Zhao, H.

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Patent Reviews: 6,570,696 B2; 6,570,710; 6,580,513 B2; 6,580,554 B2; 6,583,880; 6,583,916; 6,587,288; 6,590,649 B1; 6,594,091; 6,597,510 von Brunsting, A., Amirkhanian, V. D., Cohn, G. E., Daniels, S., Decker, J. A., Fisher, D. S., Gaynor, E. S., Hilliard, R. L., Horwitz, B. A., Lee, K. K., Lee, W.-H., Loewen, E. G., Masters, B. R., Miranda, H. A., Mitchell, G. L., Parretta, A., Rich, D. C., Schall, H. B., Simpson, M. J., Tseng, S.-M., Walczak, A., Walecki, W. J., Webb, R. H., Zhao, H.

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