Monitoring the microstructure of nanosized palladium layers obtained via thermal and VUV stimulated MOCVD von Kuchumov, B.M., Koretskaya, T.P., Igumenov, I.K., Maksimovskii, E.A., Voronov, Yu.P.

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Study of fast diffusion species in Sc/Si multilayers by W-based marker analysis von Voronov, D.L., Zubarev, E.N., Kondratenko, V.V., Pershin, Yu.P., Sevryukova, V.A., Bugayev, Ye.A.

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Superconducting Hot Electron Bolometer Mixer for Middle IR Range von Svechnikov, S.I., Finkel, M.I., Maslennikov, S.N., Vachtomin, Yu.B., Smirnov, K.V., Seleznev, V.A., Korotetskaya, Yu.P., Kaurova, N.S., Voronov, B.M., Gol'tsman, G.N.

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Damage of Sc/Si multilayer mirrors exposed to intense nanosecond 46.9 nm laser pulses von Vaschenko, G., Grisham, M., Menoni, C.S., Rocca, J.J., Pershyn, Yu.P., Zubarev, E.N., Voronov, D.L., Sevryukova, V.A., Kondratenko, V.V., Vinogradov, A.V., Artioukov, I.A.

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Damage of Se/Si multilayer mirrors exposed to intense nanosecond 46.9 nm laser pulses von Vaschenko, G., Grisham, M., Menoni, C.S., Rocca, J.J., Pershyn, Yu.P., Zubarev, E.N., Voronov, D.L., Sevryukova, V.A., Kondratenko, V.V., Vinogradov, A.V., Artioukov, I.A.

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