Independent Subsystems of Atomic Hydrogen in Silicon Responsible for Boron Passivation and for Dimer Production von Voronkov, Vladimir V.

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Formation, dissociation, and diffusion of various hydrogen dimers in silicon von Voronkov, Vladimir V., Falster, Robert

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Two Kinds of Hydrogen Monomers Manifested in Plasma-Exposed Silicon von Voronkov, Vladimir V.

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Properties of Hydrogen Species in n‐Type Silicon Deduced from In‐Diffusion Profiles von Voronkov, Vladimir V., Falster, Robert

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Trap‐Limited Vacancy Diffusion in Silicon at High Temperatures von Voronkov, Vladimir V.

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Easy-to-apply methodology to measure the hydrogen concentration in boron-doped crystalline silicon von Walter, Dominic C., Bredemeier, Dennis, Falster, Robert, Voronkov, Vladimir V., Schmidt, Jan

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Impact of hydrogen on the boron-oxygen-related lifetime degradation and regeneration kinetics in crystalline silicon von Helmich, Lailah, Walter, Dominic C., Falster, Robert, Voronkov, Vladimir V., Schmidt, Jan

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On the kinetics of the exchange of hydrogen between hydrogen–boron pairs and hydrogen dimers in crystalline silicon von Walter, Dominic C., Voronkov, Vladimir V., Falster, Robert, Bredemeier, Dennis, Schmidt, Jan

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Fast and Slow Stages of Lifetime Degradation by Boron–Oxygen Centers in Crystalline Silicon von Schmidt, Jan, Bothe, Karsten, Voronkov, Vladimir V., Falster, Robert

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Modelling plasma‐induced hydrogen profiles in boron‐doped and near‐intrinsic silicon von Voronkov, Vladimir V., Falster, Robert

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Minority carrier lifetime in indium doped silicon for photovoltaics von Murphy, John D., Pointon, Alex I., Grant, Nicholas E., Shah, Vishal A., Myronov, Maksym, Voronkov, Vladimir V., Falster, Robert J.

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Vacancy Species Produced by Rapid Thermal Annealing of Silicon Wafers von Falster, Robert, Voronkov, Vladimir V.

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Fast and Slow Vacancies in Silicon von Voronkov, Vladimir V., Falster, Robert

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Intrinsic Point Defects in Silicon Crystal Growth von Voronkov, Vladimir V., Falster, Robert

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Simplified Two-Dimensional Quantification of the Grown-in Microdefect Distributions in Czochralski Grown Silicon Crystals von Kulkarni, Milind S., Voronkov, Vladimir V.

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Light-Induced Boron-Oxygen Recombination Centres in Silicon: Understanding their Formation and Elimination von Voronkov, Vladimir V., Falster, Robert

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Multiplicity of Nitrogen Species in Silicon: The Impact on Vacancy Trapping von Voronkov, Vladimir V., Falster, Robert J.

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Intrinsic Point Defects in Silicon: a Unified View from Crystal Growth, Wafer Processing and Metal Diffusion von Voronkov, Vladimir V., Falster, Robert J.

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Lifetime recovery in p -type Czochralski silicon due to the reconfiguration of boron-oxygen complexes via a hole-emitting process von Lim, Bianca, Voronkov, Vladimir V., Falster, Robert, Bothe, Karsten, Schmidt, Jan

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Light-induced Lifetime Degradation in Boron-doped Czochralski Silicon: Are Oxygen Dimers Involved? von Voronkov, Vladimir V., Falster, Robert, Bothe, Karsten, Lim, Bianca

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