Comparison of optical and stylus methods for measurement of surface texture von Vorburger, T. V., Rhee, H.-G., Renegar, T. B., Song, J.-F., Zheng, A.

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Applications of cross-correlation functions von Vorburger, T.V., Song, J.-F., Chu, W., Ma, L., Bui, S.H., Zheng, A., Renegar, T.B.

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The National Ballistics Imaging Comparison (NBIC) project von Song, J, Vorburger, T.V, Ballou, S, Thompson, R.M, Yen, J, Renegar, T.B, Zheng, A, Silver, R.M, Ols, M

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Evaluation of polydimethylsiloxane modification methods for cell response von Pakstis, L. M., Dunkers, J. P., Zheng, A., Vorburger, T. V., Quinn, T. P., Cicerone, M. T.

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Topography measurements and applications in ballistics and tool mark identifications von Vorburger, T V, Song, J, Petraco, N

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The Second National Ballistics Imaging Comparison (NBIC-2) von Vorburger, T V, Yen, J, Song, J F, Thompson, R M, Renegar, T B, Zheng, A, Tong, M, Ols, M

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The effect of tip size on the measured Ra of surface roughness specimens with rectangular profiles von Song, J., Renegar, T.B., Soons, J., Muralikrishnan, B., Villarrubia, J., Zheng, A., Vorburger, T.V.

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Development of ballistics identification-from image comparison to topography measurement in surface metrology von Song, J, Chu, W, Vorburger, T V, Thompson, R, Renegar, T B, Zheng, A, Yen, J, Silver, R, Ols, M

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Direct and inverse problems for light scattered by rough surfaces von Marx, E, Vorburger, T V

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Applications of surface metrology in firearm identification von Zheng, X, Soons, J, Vorburger, T V, Song, J, Renegar, T, Thompson, R

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Regimes of surface roughness measurable with light scattering von Vorburger, T V, Marx, E, Lettieri, T R

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A fast algorithm for determining the Gaussian filtered mean line in surface metrology von Yuan, Y.-B., Qiang, X.-F., Song, J.-F., Vorburger, T.V.

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Topography measurements for determining the decay factors in surface replication von Song, J, Rubert, P, Zheng, A, Vorburger, T V

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The role of periodic interferometer errors in the calibration of capacitance displacement sensors for nanometrology applications von Köning, R, Dixson, R, Fu, J, Vorburger, T V

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An iterative algorithm for calculating stylus radius unambiguously von Vorburger, T V, Zheng, A, Renegar, T B, Song, J -F, Ma, L

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Stylus profiling at high resolution and low force von Song, J F, Vorburger, T V

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Autocorrelation functions from optical scattering for one-dimensionally rough surfaces von Marx, E, Leridon, B, Lettieri, T R, Song, J F, Vorburger, T V

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Comparison between precision roughness master specimens and their electroformed replicas von Song, J.F., Vorburger, T.V., Rubert, P.

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The measurement and uncertainty of a calibration standard for the scanning electron microscope von FU, J, CROARKIN, M. C, VORBURGER, T. V

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Standard reference specimens in quality control of engineering surfaces von SONG, J. F, VORBURGER, T. V

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