Particle size distributions by transmission electron microscopy: an interlaboratory comparison case study von Rice, Stephen B, Chan, Christopher, Brown, Scott C, Eschbach, Peter, Han, Li, Ensor, David S, Stefaniak, Aleksandr B, Bonevich, John, Vladár, András E, Walker, Angela R Hight, Zheng, Jiwen, Starnes, Catherine, Stromberg, Arnold, Ye, Jia, Grulke, Eric A

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Detecting nanoscale contamination in semiconductor fabrication using through-focus scanning optical microscopy von Rim, Min-Ho, Agocs, Emil, Dixson, Ronald, Kavuri, Prem, Vladár, András E., Attota, Ravi Kiran

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Ionizing radiation processing and its potential in advancing biorefining and nanocellulose composite materials manufacturing von Postek, Michael T., Poster, Dianne L., Vládar, András E., Driscoll, Mark S., LaVerne, Jay A., Tsinas, Zois, Al-Sheikhly, Mohamad I.

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Does your SEM Really tell the truth?-how would you know? Part 1 von Postek, Michael T., Vladár, András E.

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Does your SEM really tell the truth? How would you know? Part 2 von Postek, Michael T., Vladár, András E., Purushotham, Kavuri P.

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New insights into subsurface imaging of carbon nanotubes in polymer composites via scanning electron microscopy von Zhao, Minhua, Ming, Bin, Kim, Jae-Woo, Gibbons, Luke J, Gu, Xiaohong, Nguyen, Tinh, Park, Cheol, Lillehei, Peter T, Villarrubia, J S, Vladár, András E, Alexander Liddle, J

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Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope von Postek, Michael T., Vladár, András E., Villarrubia, John S., Muto, Atsushi

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A method to determine the number of nanoparticles in a cluster using conventional optical microscopes von Kang, Hyeonggon, Attota, Ravikiran, Tondare, Vipin, Vladár, András E., Kavuri, Premsagar

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Three-dimensional deep sub-wavelength defect detection using λ = 193 nm optical microscopy von Barnes, Bryan M, Sohn, Martin Y, Goasmat, Francois, Zhou, Hui, Vladár, András E, Silver, Richard M, Arceo, Abraham

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Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) Stereophotogrammetry von Tondare, Vipin N., Villarrubia, John S., Vladár, András E.

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Modeling for accurate dimensional scanning electron microscope metrology: then and now von Postek, Michael T., Vladár, András E.

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Recovery of Background Structures in Nanoscale Helium Ion Microscope Imaging von Carasso, Alfred S, Vladár, András E

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Nondestructive shape process monitoring of three-dimensional, high-aspect-ratio targets using through-focus scanning optical microscopy von Attota, Ravi Kiran, Kang, Hyeonggon, Scott, Keana, Allen, Richard, Vladar, Andras E, Bunday, Benjamin

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Helium ion microscopy and its application to nanotechnology and nanometrology von Postek, Michael T., Vladár, Andras E.

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Probing Electrified Liquid–Solid Interfaces with Scanning Electron Microscopy von Guo, Hongxuan, Yulaev, Alexander, Strelcov, Evgheni, Tselev, Alexander, Arble, Christopher, Vladar, Andras E, Villarrubia, John S, Kolmakov, Andrei

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Fractional Diffusion, Low Exponent Lévy Stable Laws, and 'Slow Motion' Denoising of Helium Ion Microscope Nanoscale Imagery von Carasso, Alfred S, Vladár, András E

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Disinfection of Respirators with Ultraviolet Radiation von Poster, Dianne L, Hardwick, Matthew, Miller, C Cameron, Riley, Michael A, Rodrigo, W W Shanaka I, Vladar, Andras E, Wright, John D, Zangmeister, Christopher D, Zarobila, Clarence, Starkweather, Jeremy, Wynne, John, Yilzarde, Jason

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Tuning Geometric Chirality in Metallic and Hybrid Nanostructures by Controlled Nanoscale Crystal Symmetry Breaking von Liu, Hanyu, Vladár, András E., Wang, Peng-Peng, Ouyang, Min

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Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope von Postek, Michael T., Villarrubia, John, Vladar, Andras E., Muto, Atsushi

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Understanding Imaging and Metrology with the Helium Ion Microscope von Postek, Michael T, Vladar, Andras E, Ming, Bin

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