Influence of humidity on the fretting wear of self-mated tetragonal zirconia ceramics von Basu, B, Vitchev, R.G, Vleugels, J, Celis, J.P, Van Der Biest, O

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Surface oxidation of NiTi shape memory alloy von Firstov, G.S, Vitchev, R.G, Kumar, H, Blanpain, B, Van Humbeeck, J

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Cesium/xenon co-sputtering at different energies during ToF-SIMS depth profiling von Brison, J., Vitchev, R.G., Houssiau, L.

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Cesium redeposition artifacts during low energy ToF-SIMS depth profiling von Vitchev, R.G., Brison, J., Houssiau, L.

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Measurement and modeling of work function changes during low energy cesium sputtering von Brison, J., Mine, N., Poisseroux, S., Douhard, B., Vitchev, R.G., Houssiau, L.

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Depth distribution of Cs implanted into Si at steady-state during dual beam ToF-SIMS profiling von Vitchev, R.G., Brison, J., Houssiau, L.

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X-ray photoelectron spectroscopy characterisation of high-k dielectric Al2O3 and HfO2 layers deposited on SiO2/Si surface von VITCHEV, R. G, PIREAUX, J. J, CONARD, T, BENDER, H, WOLSTENHOLME, J, DEFRANOUX, Chr

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Effect of crystallographic orientation on fretting wear behaviour of MoSx coatings in dry and humid air von ZHANG, X, VITCHEV, R. G, LAUWERENS, W, STALS, L, HE, J, CELIS, J.-P

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On the understanding of positive and negative ionization processes during ToF-SIMS depth profiling by co-sputtering with cesium and xenon von Brison, J., Guillot, J., Douhard, B., Vitchev, R.G., Migeon, H.-N., Houssiau, L.

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Transfer of molybdenum sulphide coating material onto corundum balls in fretting wear tests von Zhang, Xiaoling, Vitchev, R.G, Lauwerens, W, He, Jiawen, Celis, J.-P

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ToF-SIMS depth profiling of Hf and Al composition variations in ultrathin mixed HfO2/Al2O3 oxides von Houssiau, L., Vitchev, R.G., Conard, T., Vandervorst, W., Bender, H.

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ToF-SIMS depth profiling of Hf and Al composition variations in ultrathin mixed HfO 2/Al 2O 3 oxides von Houssiau, L., Vitchev, R.G., Conard, T., Vandervorst, W., Bender, H.

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Effective attenuation length of Al Kα-excited Si2p photoelectrons in SiO2, Al2O3 and HfO2 thin films von Vitchev, R G, Defranoux, Chr, Wolstenholme, J, Conard, T, Bender, H, Pireaux, J J

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Transfer of molybdenum sulphide coating material onto corundum balls in fretting wear tests von Zhang, Xiaoling, Vitchev, R.G, Lauwerens, W, He, Jiawen, Celis, Jean-Pierre

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X-ray photoelectron spectroscopy characterisation of high-k dielectric Al 2O 3 and HfO 2 layers deposited on SiO 2/Si surface von Vitchev, R.G., Pireaux, J.J., Conard, T., Bender, H., Wolstenholme, J., Defranoux, Chr

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Surface oxidation of NiTi shape memory alloy von Firstov, G.S, Vitchev, R.G, Kumar, K.C. Hari, Blanpain, Bart, Van Humbeeck, Jan

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Effective attenuation length of Al Kα-excited Si2p photoelectrons in SiO 2, Al 2O 3 and HfO 2 thin films von Vitchev, R.G., Defranoux, Chr, Wolstenholme, J., Conard, T., Bender, H., Pireaux, J.J.

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Electronic spectroscopic study of the tribochemical modifications of TiN-corundum pairs after fretting wear von Vitchev, R.G, Blanpain, Bart, Celis, Jean-Pierre

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Electronic spectroscopic study of the tribochemical modifications of TiN–corundum pairs after fretting wear von Vitchev, R.G, Blanpain, B, Celis, J.P

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Effect of crystallographic orientation on fretting wear behaviour of MoS x coatings in dry and humid air von Zhang, X, Vitchev, R.G, Lauwerens, W, Stals, L, He, J, Celis, J.-P

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