Robust efficiency measures for linear knapsack problem variants von Wishon, Christopher, Villalobos, J. Rene

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Information-based inspection allocation for real-time inspection systems von Verduzco, Adan, Villalobos, J.Rene, Vega, Benjamin

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Using fixed and adaptive multivariate SPC charts for online SMD assembly monitoring von Villalobos, J.René, Muñoz, Luis, Gutierrez, Marco A.

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Flexible Inspection within an Aggregated Information Environment von Foster, Joseph W., Malave, Cesar O., Villalobos, J.Rene

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Some results from a model of dynamic inspection allocation von Villalobos, J.René, Foster, Joseph W.

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Automated visual inspection of bare printed circuit boards von Griffin, Paul M., Villalobos, J.René, Foster, Joseph W., Messimer, Sherri L.

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A simple statistic for the detection of missing components on PCBs von Foster, Joseph W., Kona, Sudheer R., Villalobos, J.René

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Automated visual inspection: A tutorial von Foster, Joseph W, Griffin, Paul M, Messimer, Sherri L, Villalobos, J.René

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