Contribution of x-ray topography and high-resolution diffraction to the study of defects in SiC von Dudley, Michael, Huang, XianRong, Vetter, William M

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Partial dislocations in the X-ray topography of as-grown hexagonal silicon carbide crystals von Vetter, William M, Dudley, Michael

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Structural Distortion of the TpCo-L Fragment (Tp = tris(pyrazolyl)borate). Analysis by X-ray Diffraction and Density Functional Theory von Detrich, Jennifer L, Konečný, Robert, Vetter, William M, Doren, Douglas, Rheingold, Arnold L, Theopold, Klaus H

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Micropipes and the closure of axial screw dislocation cores in silicon carbide crystals von Vetter, William M., Dudley, Michael

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Basal plane slip and formation of mixed-tilt boundaries in sublimation-grown hexagonal polytype silicon carbide single crystals von Ha, Seoyong, Skowronski, Marek, Vetter, William M., Dudley, Michael

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Characterization of defects in 3C-silicon carbide crystals von Vetter, William M., Dudley, Michael

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High-resolution x-ray topography of dislocations in 4H-SiC epilayers von Kamata, Isaho, Tsuchida, Hidekazu, Vetter, William M., Dudley, Michael

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Enlargement of Step-Free SiC Surfaces by Homoepitaxial Web-Growth of Thin SiC Cantilevers von Neudeck, Philip G., Powell, J. Anthony, Beheim, Glenn M., Benavage, Emye L., Abel, Phillip B., Trunek, Andrew J., Spry, David J., Dudley, Michael, Vetter, William M.

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Recognition of Dyes by K2SO4 Crystals: Choosing Organic Guests for Simple Salts von Kelley, Michael P, Janssens, Bart, Kahr, Bart, Vetter, William M

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Oxidation-Induced Crystallographic Transformation in Heavily N-Doped 4H-SiC Wafers von Vetter, William M., Dudley, Michael, Gehoski, T., Poweleit, C.D., Palle, K., Moore, K., Skromme, B.J., Bryant, L.R.

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Material defects in 4H-silicon carbide diodes von Zimmermann, U., Osterman, J., Kuylenstierna, D., Hallén, Anders, Konstantinov, A. O., Vetter, W. M., Dudley, M.

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Synthesis, characterization, and reactivity of .alpha.-ketoacyl complexes of platinum(II) and palladium(II). Crystal structures of trans-Pt(PPh3)2(Cl)(COCOPh) and cis-Pt(PPh3)2(COP... von Sen, Ayusman, Chen, Jwu Ting, Vetter, William M, Whittle, Robert R

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Synchrotron white beam topography characterization of physical vapor transport grown AlN and ammonothermal GaN von Raghothamachar, Balaji, Vetter, William M., Dudley, Michael, Dalmau, Rafael, Schlesser, Raoul, Sitar, Zlatko, Michaels, Emily, Kolis, Joseph W.

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Micropipes in Silicon Carbide Crystals: Do all Screw Dislocations have Open Cores? von Vetter, William M., Dudley, Michael

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The perfection and defect structure of organic hourglass inclusion K2SO4 crystals von VETTER, William M, TOTSUKA, Hirono, DUDLEY, Michael, KAHR, Bart

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Synchrotron white-beam topographic studies of 2H–SiC crystals von Vetter, William M, Huang, Wei, Neudeck, Philip, Powell, J.Anthony, Dudley, Michael

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Outstanding Meeting Paper/Article: High-resolution x-ray topography of dislocations in 4H-SiC epilayers von Kamata, Isaho, Tsuchida, Hidekazu, Vetter, William M, Dudley, Michael

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Behavior of Basal Plane Dislocations and Low Angle Grain Boundary Formation in Hexagonal Silicon Carbide von Chen, Yi, Vetter, William M., Dudley, Michael, Ma, Rong Hui, Dhanaraj, Govindhan

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Chemistry of metal oxo alkyl complexes. Mechanistic studies on the anaerobic and aerobic decompositions of molybdenum(VI) dioxo dialkyl complexes von Vetter, William M, Sen, Ayusman

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Hexagonal voids and the formation of micropipes during SiC sublimation growth von Kuhr, Thomas A., Sanchez, Edward K., Skowronski, Marek, Vetter, William M., Dudley, Michael

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