White light interferometry for quantitative surface characterization in ion sputtering experiments von Baryshev, S.V., Zinovev, A.V., Tripa, C.E., Erck, R.A., Veryovkin, I.V.

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Formation of neutral clusters during sputtering of gold von King, B.V., Veryovkin, I.V., Moore, J.F., Calaway, W.F., Pellin, M.J.

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TOF SIMS characterization of SEI layer on battery electrodes von Veryovkin, I.V., Tripa, C.E., Zinovev, A.V., Baryshev, S.V., Li, Y., Abraham, D.P.

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Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal refe... von Choi, Y., Eng, P., Stubbs, J., Sutton, S.R., Schmeling, M., Veryovkin, I.V., Burnett, D.

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RIMS analysis of Ca and Cr in Genesis solar wind collectors von Veryovkin, I. V., Tripa, C. E., Zinovev, A. V., King, B. V., Pellin, M. J., Burnett, D. S.

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Comparison of laser ablation and sputter desorption of clusters from Au7Cu5Al4 von King, B.V., Moore, J.F., Cui, Y., Veryovkin, I.V., Tripa, C.E.

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Combination of imaging mass spectrometry and electron microscopy for quasi nondestructive surface analysis von Baryshev, S.V., Zinovev, A.V., Tripa, C.E., Veryovkin, I.V.

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Sputtering of neutral clusters from silver–gold alloys von King, B.V., Moore, J.F., Veryovkin, I.V., Zinovev, A.V., Pellin, M.J.

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Sputtering of clusters from copper–gold alloys von King, B.V., Moore, J.F., Zinoviev, A.V., Veryovkin, I.V., Pellin, M.J.

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7.87 eV postionization of peptides containing tryptophan or derivatized with fluorescein von Hanley, L., Edirisinghe, P.D., Calaway, W.F., Veryovkin, I.V., Pellin, M.J., Moore, J.F.

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New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications von Belykh, S. F., Palitsin, V. V., Veryovkin, I. V., Kovarsky, A. P., Chang, R. J. H., Adriaens, A., Dowsett, M. G., Adams, F.

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Laser-Driven Acoustic Desorption of Organic Molecules from Back-Irradiated Solid Foils von Zinovev, Alexander V, Veryovkin, Igor V, Moore, Jerry F, Pellin, Michael J

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Alkali-metal-enhanced grain growth in Cu2ZnSnS4 thin filmsElectronic supplementary information (ESI) available: Additional TOF-SIMS experimental details and additional characteriza... von Johnson, M, Baryshev, S. V, Thimsen, E, Manno, M, Zhang, X, Veryovkin, I. V, Leighton, C, Aydil, E. S

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Alkali-metal-enhanced grain growth in Cu sub(2)ZnSnS sub(4) thin films von Johnson, M, Baryshev, S V, Thimsen, E, Manno, M, Zhang, X, Veryovkin, I V, Leighton, C, Aydil, E S

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High-resolution SIMS depth profiling of nanolayers von Baryshev, S. V., Zinovev, A. V., Tripa, C. E., Pellin, M. J., Peng, Q., Elam, J. W., Veryovkin, I. V.

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Characterization of surface modifications by white light interferometry: applications in ion sputtering, laser ablation, and tribology experiments von Baryshev, Sergey V, Erck, Robert A, Moore, Jerry F, Zinovev, Alexander V, Tripa, C Emil, Veryovkin, Igor V

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Analyzing individual presolar grains with CHARISMA von Savina, Michael R., Pellin, Michael J., Tripa, C.Emil, Veryovkin, Igor V., Calaway, Wallis F., Davis, Andrew M.

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Mass spectrometry on the nanoscale with ion sputtering based techniques: What is feasible von Veryovkin, Igor V., Calaway, Wallis F., Tripa, C. Emil, Pellin, Michael J.

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Formation of neutral clusters during sputterig of gold von King, B. V., Veryovkin, I. V., Moore, J. F., Pellin, M. J., Calaway, W. F., Univ. Newcastle, Mass Think, LLC

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Measuring roughness of buried interfaces by sputter depth profiling von Baryshev, S V, Klug, J A, Zinovev, A V, Tripa, C E, Elam, J W, Veryovkin, I V

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