A 450-Mb/s analog front end for PRML read channels von Bloodworth, B.E., Siniscalchi, P.P., De Veirman, G.A., Jezdic, A., Pierson, R., Sundararaman, R.

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‘3-Dimensional’ TEM silicon-device analysis by combining plan-view and FIB sample preparation von De Veirman, A.E.M.

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Structural and electrical characterization of heteroepitaxial lead zirconate titanate thin films von de Keijser, M., Cillessen, J. F. M., Janssen, R. B. F., De Veirman, A. E. M., de Leeuw, D. M.

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Inverted spin valves for magnetic heads and sensors von Lenssen, K.-M. H., De Veirman, A. E. M., Donkers, J. J. T. M.

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Columnar microstructures in magnetron-sputtered refractory metal thin films of tungsten, molybdenum and W-Ti-(N) von Dirks, A.G., Wolters, R.A.M., De Veirman, A.E.M.

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The use of a focused-ion-beam machine to prepare transmission electron microscopy samples of residual photoresist von De Veirman, A, Weaver, L

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The structure of heteroepitaxial lead titanate layers grown by organometallic chemical vapour deposition von de Keijser, M., de Leeuw, D.M., van Veldhoven, P.J., De Veirman, A.E.M., Neerinck, D.G., Dormans, G.J.M.

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Pulse switching characterization of organometallic chemical vapor deposited PbZrxTi1−xO3 thin films for high-density memory applications von Taylor, D. J., Larsen, P. K., Dormans, G. J. M., de Veirman, A. E.M

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Spectroscopic ellipsometry and transmission electron microscopy study of annealed high-dose oxygen implanted silicon von VANHELLEMONT, J, MAES, H. E, DE VEIRMAN, A

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Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi5 von De Veirman, A. E. M., Staals, A. A., Notten, P. H. L.

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Relation between Surface Contamination of Metals and Defect Formation in Si during Oxidation of Bulk- and SOI-Wafers von Rink, Ingrid, Janssen, A.J., De Veirman, A.

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Defects in high-dose oxygen implanted silicon: a TEM study von De Veirman, A, Van Landuyt, J, Vanhellemont, J, E Maes, H, Yallup, K

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A 3.0 V 40 Mb/s hard disk drive read channel IC von De Veirman, G.A., Ueda, S., Cheng, J., Tam, S., Fukahori, K., Kurisu, M., Shinozaki, E.

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Transmission electron microscopy study of PbTiO3 and PbZrxTi1−xO3 films von De Veirman, A. E. M., Staals, A. A., Klee, M., Larsen, P. K.

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TEM study of combined oxygen and nitrogen implanted silicon von De Veirman, A., van Landuyt, J., Skorupa, W.

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Hetero-epitaxial oxidic conductor La1-xSrxCoO3 prepared by pulsed laser deposition von CILLESSEN, J. F. M, WOLF, R. M, DE VEIRMAN, A. E. M

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Spectroscopic ellipsometry studies of SIMOX structures and correlation with cross-section TEM von Vanhellemont, J, Maes, HE, De Veirman, A

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Grain size and strain in thin sputter-deposited Ni0.8Fe0.2 and Cu films von NEERINCK, D. G, DE VEIRMAN, A. E. M, SLANGEN, M. H. J, RIJKS, T. G. S. M, KOOLS, J. C. S

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Design of a bipolar 10-MHz programmable continuous-time 0.05° equiripple linear phase filter von DE VEIRMAN, G. A, YAMASAKI, R. G

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A new diamond-related compound in the system Al2O3-Al4C3-AlN von GROEN, W. A, KRAAN, M. J, VAN HAL, P. F, DE VEIRMAN, A. E. M

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