Spectroscopic ellipsometry: a historical overview von Vedam, K.

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Knowledge and attitude on infant oral health among graduating medical students in kulasekaram von Chellaih, P, Sivadas, G, V Vaishnavi Vedam

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Effect of anti-asthmatic drugs on dental health: A comparative study von Chellaih, P, Sivadas, G, Chintu, S, Vaishnavi Vedam, V, Arunachalam, Rajeev, Sarsu, M

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Traumatic ulcerative granuloma with stromal eosinophilia - Mystery of pathogenesis revisited von Sarangarajan, R, Vaishnavi Vedam, V K, Sivadas, G, Sarangarajan, Anuradha, Meera, S

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Prognostic Efficacy of Nuclear Morphometry at Invasive Front of Oral Squamous Cell Carcinoma: An Image Analysis Microscopic Study von Vedam, V. K. Vaishnavi, Natarajan, Srikant, Boaz, Karen

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Congenital Hemifacial Hyperplasia: Clinical Presentation and Literature Review von Sathish, Sivan, Ganapathy, Sivadas, Vedam, V. K. Vaishnavi, Shanmugasundaram, Karpagavalli, Satti, Parvathi

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Salivary Amylase as a Marker of Salivary Gland Function in Patients Undergoing Radiotherapy for Oral Cancer von Vedam, V. K. Vaishnavi, Boaz, Karen, Natarajan, Srikant, Ganapathy, Sivadas

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Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materials von Chindaudom, P, Vedam, K

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Thin-film deposition by a new laser ablation and plasma hybrid technique von KRISHNASWAMY, J, RENGAN, A, NARAYAN, J, VEDAM, K, MCHARGUE, C. J

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Determination of the optical function n(λ) of vitreous silica by spectroscopic ellipsometry with an achromatic compensator von Chindaudom, P, Vedam, K

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Determination of the optical constants of an inhomogeneous transparent LaF3 thin film on a transparent substrate by spectroscopic ellipsometry von CHINDAUDOM, P, VEDAM, K

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Fast scanning spectroelectrochemical ellipsometry: In-situ characterization of gold oxide von Kim, Y.-T., Collins, R.W., Vedam, K.

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Nondestructive depth profiling by spectroscopic ellipsometry von VEDAM, K, MCMARR, P. J, NARAYAN, J

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Spectroscopic ellipsometry: A new tool for nondestructive depth profiling and characterization of interfaces von McMarr, P. J., Vedam, K., Narayan, J.

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Studies on inhomogeneous transparent optical coatings on transparent substrates by spectroscopic ellipsometry von Chindaudom, P., Vedam, K.

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Real time spectroscopic ellipsometry : in situ characterization of pyrrole electropolymerization von KIM, Y.-T, COLLINS, R. W, VEDAM, K, ALLARA, D. L

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Spectroscopic ellipsometry studies on ion beam sputter deposited Pb(Zr, Ti)O3 films on sapphire and Pt-coated silicon substrates von TROLIER-MCKINSTRY, S, HU, H, KRUPANIDHI, S. B, CHINDAUDOM, P, VEDAM, K, NEWNHAM, R. E

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Pseudoepitheliomatous Hyperplasia: Relevance in Oral Pathology von Sarangarajan, R, Vedam, V K Vaishnavi, Sivadas, G, Krishnaraj, R, Sarangarajan, Anuradha, Shanmugam, K T

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Ion-implantation induced anomalous surface amorphization in silicon von Lohner, T., Kótai, E., Khánh, N.Q., Tóth, Z., Fried, M., Vedam, K., Nguyen, N.V., Hanekamp, L.J., van Silfhout, A.

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Spectroscopic ellipsometry studies of crystalline silicon implanted with carbon ions von NGUYEN, N. V, VEDAM, K

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