Domino logic designs for high-performance and leakage-tolerant applications von Moradi, Farshad, Vu Cao, Tuan, Vatajelu, Elena I., Peiravi, Ali, Mahmoodi, Hamid, Wisland, Dag T.

Volltext

Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric von Vatajelu, E. I., Gómez-Pau, A., Renovell, M., Figueras, J.

Volltext

Sram cell stability metric under transient voltage noise von Vătăjelu, Elena I., Gómez-Pau, Álvaro, Renovell, Michel, Figueras, Joan

Volltext

Statistical analysis of 6T SRAM data retention voltage under process variation von Vatajelu, Elena I., Figueras, Joan

Volltext bestellen

Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation von Vatajelu, Elena I., Figueras, Joan

Volltext

Parametric failure analysis of embedded SRAMs using fast & accurate dynamic analysis von Vatajelu, Elena I, Panagopoulos, Georgios, Roy, Kaushik, Figueras, Joan

Volltext

Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation von Vatajelu, E. I., Figueras, J.

Volltext

Reliability estimation at block-level granularity of spin-transfer-torque MRAMs von Di Carlo, Stefano, Indaco, Marco, Prinetto, Paolo, Vatajelu, Elena Ioana, Rodríguez Montañés, Rosa, Figueras Pàmies, Joan

Volltext bestellen

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell von Vatajelu, Elena I., Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Wrobel, F., Salgne, F.

Volltext

STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations von Vatajelu, Elena Ioana, Rodríguez Montañés, Rosa, Indaco, Marco, Prinetto, Paolo, Figueras Pàmies, Joan

Volltext bestellen

Power-aware voltage tuning for STT-MRAM reliability von Vatajelu, Elena Ioana, Rodríguez Montañés, Rosa, Di Carlo, Stefano, Renovell, Michel, Prinetto, Paolo, Figueras Pàmies, Joan

Volltext bestellen

Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures von Vatajelu, E. I., Bosio, A., Dilillo, L., Girard, P., Todri, A., Virazel, A., Badereddine, N.

Volltext bestellen

SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations von Tsiligiannis, G., Vatajelu, Elena I., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Wrobel, F., Saigne, F.

Volltext

Analyzing resistive-open defects in SRAM core-cell under the effect of process variability von Vatajelu, Elena I., Bosio, A., Dilillo, L., Girard, P., Todri, A., Virazel, A., Badereddine, N.

Volltext

Bi-sigmoid spike-timing dependent plasticity learning rule for magnetic tunnel junction-based SNN von Daddinounou, Salah, Vatajelu, Elena-Ioana

Volltext

SRAM-Based PUF Readouts von Vinagrero, Sergio, Martin, Honorio, de Bignicourt, Alice, Vatajelu, Elena-Ioana, Di Natale, Giorgio

Volltext

Python Framework for Modular and Parametric SPICE Netlists Generation von Vinagrero Gutiérrez, Sergio, Di Natale, Giorgio, Vatajelu, Elena-Ioana

Volltext

Guest Editorial: Computation-In-Memory (CIM): from Device to Applications von Hamdioui, Said, Vatajelu, Elena-Ioana, Bosio, Alberto

Volltext

Analog memristive devices based on La2NiO4+ δ as synapses for spiking neural networks von Khuu, Thoai-Khanh, Koroleva, Aleksandra, Degreze, Arnaud, Vatajelu, Elena-Ioana, Lefèvre, Gauthier, Jiménez, Carmen, Blonkowski, Serge, Jalaguier, Eric, Bsiesy, Ahmad, Burriel, Mónica

Volltext

SPICE-Level Demonstration of Unsupervised Learning with Spintronic Synapses in Spiking Neural Networks von Daddinounou, Salah, Gebregiorgis, Anteneh, Hamdioui, Said, Vatajelu, Elena-Ioana

Volltext