Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs using SVM Classifiers von Xama, Nektar, Gomez, Jhon, Dobbelaere, Wim, Vanhooren, Ronny, Coyette, Anthony, Gielen, Georges

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Experimental Validation of a Compact Pinhole Latent Defect Model for MOS Transistors von Gomez, Jhon, Xama, Nektar, Lootens, Dirk, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges

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Experimental Validation of a Compact Pinhole Latent Defect Model for MOS Transistors von Gomez, Jhon, Xama, Nektar, Lootens, Dirk, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges

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DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value von Gomez, Jhon, Xama, Nektar, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges

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Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs using SVM Classifiers von Xama, nektar, Gomez Caicedo, jhon alexander, Dobbelaere, wim, Vanhooren, Ronny, Coyette, Anthony, Gielen, Georges

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DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value von Gomez, Jhon, Xama, Nektar, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges

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Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations von Xama, Nektar, Andraud, Martin, Gomez, Jhon, Esen, Baris, Dobbelaere, Wim, Vanhooren, Ronny, Coyette, Anthony, Gielen, Georges

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Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations von Xama, Nektar, Andraud, Martin, Gomez, Jhon, Esen, Baris, Dobbelaere, Wim, Vanhooren, Ronny, Coyette, Anthony, Gielen, Georges

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Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization von Coyette, Anthony, Esen, Baris, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges

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Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization von Coyette, Anthony, Esen, Vahap Baris, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges

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Non-intrusive detection of defects in mixed-signal integrated circuits using light activation von Esen, Vahap Baris, Coyette, Anthony, Xama, Nektar, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges

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Effective DC fault models and testing approach for open defects in analog circuits von Esen, Vahap Baris, Coyette, Anthony, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges

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Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis von Coyette, Anthony, Esen, Vahap Baris, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges

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Design and test of analog circuits towards sub-ppm level von Gielen, Georges, Dobbelaere, Wim, Vanhooren, Ronny, Coyette, Anthony, Esen, Vahap Baris

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Automated Testing of Mixed-Signal Integrated Circuits by Topology Modification von Coyette, Anthony, Esen, Vahap Baris, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges

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High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis von Gomez, Jhon, Xama, Nektar, Coyette, Anthony, Vanhooren, Ronny, Dobbelaere, Wim, Gielen, Georges

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ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed-Signal Integrated Circuits von Coyette, Anthony, Esen, Baris, Xama, Nektar, Gielen, Georges, Dobbelaere, Wim, Vanhooren, Ronny

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An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes von Esen, Baris, Coyette, Anthony, Xama, Nektar, Gielen, Georges, Dobbelaere, Wim, Vanhooren, Ronny

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A very low cost and highly parallel DfT method for analog and mixed-signal circuits von Esen, Vahap Baris, Coyette, Anthony, Xama, Nektar, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges

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Automatic Testing of Analog ICs for Latent Defects using Topology Modification von Xama, Nektar, Coyette, Anthony, Esen, Vahap Baris, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, Georges

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