Mechanical Properties of Native and Cross-linked Type I Collagen Fibrils von Yang, Lanti, van der Werf, Kees O., Fitié, Carel F.C., Bennink, Martin L., Dijkstra, Pieter J., Feijen, Jan

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Mechanical properties of single electrospun collagen type I fibers von Yang, Lanti, Fitié, Carel F.C, van der Werf, Kees O, Bennink, Martin L, Dijkstra, Pieter J, Feijen, Jan

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Micromechanical Testing of Individual Collagen Fibrils von van der Rijt, Joost A. J., van der Werf, Kees O., Bennink, Martin L., Dijkstra, Pieter J., Feijen, Jan

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The native architecture of a photosynthetic membrane von Hunter, C. Neil, Bahatyrova, Svetlana, Frese, Raoul N, Siebert, C. Alistair, Olsen, John D, van der Werf, Kees O, van Grondelle, Rienk, Niederman, Robert A, Bullough, Per A, Otto, Cees

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Micromechanical bending of single collagen fibrils using atomic force microscopy von Yang, Lanti, van der Werf, Kees O., Koopman, Bart F.J.M., Subramaniam, Vinod, Bennink, Martin L., Dijkstra, Pieter J., Feijen, Jan

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Atomic Force Microscopy under Controlled Conditions Reveals Structure of C-Terminal Region of α-Synuclein in Amyloid Fibrils von Sweers, Kim K. M, van der Werf, Kees O, Bennink, Martin L, Subramaniam, Vinod

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Flexibility and size heterogeneity of the LH1 light harvesting complex revealed by atomic force microscopy: functional significance for bacterial photosynthesis von Bahatyrova, Svetlana, Frese, Raoul N, van der Werf, Kees O, Otto, Cees, Hunter, C Neil, Olsen, John D

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Microscale mechanical properties of single elastic fibers: The role of fibrillin–microfibrils von Koenders, Mieke M.J.F, Yang, Lanti, Wismans, Ronnie G, van der Werf, Kees O, Reinhardt, Dieter P, Daamen, Willeke, Bennink, Martin L, Dijkstra, Pieter J, van Kuppevelt, Toin H, Feijen, Jan

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Spatially resolved frequency-dependent elasticity measured with pulsed force microscopy and nanoindentation von Sweers, Kim K. M, van der Werf, Kees O, Bennink, Martin L, Subramaniam, Vinod

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Mapping Electrostatic Forces Using Higher Harmonics Tapping Mode Atomic Force Microscopy in Liquid von van Noort, S. John T, Willemsen, Oscar H, van der Werf, Kees O, de Grooth, Bart G, Greve, Jan

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High Speed Atomic Force Microscopy of Biomolecules by Image Tracking von van Noort, S. John T., van der Werf, Kees O., de Grooth, Bart G., Greve, Jan

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Simultaneous Height and Adhesion Imaging of Antibody-Antigen Interactions by Atomic Force Microscopy von Willemsen, Oscar H., Snel, Margot M.E., van der Werf, Kees O., de Grooth, Bart G., Greve, Jan, Hinterdorfer, Peter, Gruber, Hermann J., Schindler, Hansgeorg, van Kooyk, Yvette, Figdor, Carl G.

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Tapping mode atomic force microscopy in liquid von Putman, Constant A. J., Van der Werf, Kees O., De Grooth, Bart G., Van Hulst, Niek F., Greve, Jan

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Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation von Kassies, Roel, van der Werf, Kees O., Bennink, Martin L., Otto, Cees

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Fabrication and Visualization of Metal-Ion Patterns on Glass by Dip-Pen Nanolithography von Basabe-Desmonts, Lourdes, Wu, Chien-Ching, van der Werf, Kees O., Peter, Maria, Bennink, Martin, Otto, Cees, Velders, Aldrik H., Reinhoudt, David N., Subramaniam, Vinod, Crego-Calama, Mercedes

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Compact stand‐alone atomic force microscope von van der Werf, Kees. O., Putman, Constant A. J., de Grooth, Bart G., Segerink, Frans B., Schipper, Eric H., van Hulst, Niek F., Greve, Jan

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Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy von van der Werf, Kees O., Putman, Constant A. J., de Grooth, Bart G., Greve, Jan

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Intra-laser-cavity microparticle sensing with a dual-wavelength distributed-feedback laser von Bernhardi, Edward H., van der Werf, Kees O., Hollink, Anton J. F., Wörhoff, Kerstin, de Ridder, René M., Subramaniam, Vinod, Pollnau, Markus

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Flexibility and Size Heterogeneity of the LH1 Light Harvesting Complex Revealed by Atomic Force Microscopy von Bahatyrova, Svetlana, Frese, Raoul N., van der Werf, Kees O., Otto, Cees, Hunter, C. Neil, Olsen, John D.

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Reconstruction of the Tip−Surface Interaction Potential by Analysis of the Brownian Motion of an Atomic Force Microscope Tip von Willemsen, Oscar H, Kuipers, Laurens, van der Werf, Kees O, de Grooth, Bart G, Greve, Jan

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