Error diagnosis and optimisation of c-Si solar cell processing using contact resistances determined with the Corescanner von van der Heide, A.S.H, Bultman, J.H, Hoornstra, J, Schönecker, A

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Silicon Surface Passivation by Organic Monolayers:  Minority Charge Carrier Lifetime Measurements and Kelvin Probe Investigations von Sieval, Alexander B, Huisman, Carolien L, Schönecker, Axel, Schuurmans, Frank M, van der Heide, Arvid S. H, Goossens, Albert, Sinke, Wim C, Zuilhof, Han, Sudhölter, Ernst J. R

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Explanation of high solar cell diode factors by nonuniform contact resistance von van der Heide, A. S. H., Schönecker, A., Bultman, J. H., Sinke, W. C.

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Spatially resolved assessment of power losses due to bulk material quality and metallization problems von Isenberg, J., van der Heide, A.S.H., Warta, W.

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Range of loss mechanisms accessible by illuminated lock in thermography (ILIT) von Isenberg, J, Heide, A.S.H. van der, Warta, W

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Influence of grain orientation on contact resistance at higher emitter resistances, investigated for alkaline and acid saw damage removal von Van der Heide, A.S.H., Bultman, J.H., Goris, M.J.A.A., Hoornstra, J.

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Optimizing the front side metallization process using the Corescan von van der Heide, A.S.H., Bultman, J.H., Hoomstra, J., Schonecker, A., Wyers, G.P., Sinke, W.C.

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