Possibilities of energy-resolved X-ray radiography for the investigation of paintings von Cabal Rodríguez, Ana E., Leyva Pernía, Diana, Schalm, Olivier, Van Espen, Pierre J. M.

Volltext

Partial robust M-regression von Serneels, Sven, Croux, Christophe, Filzmoser, Peter, Van Espen, Pierre J.

Volltext

How to construct a multiple regression model for data with missing elements and outlying objects von Stanimirova, Ivana, Serneels, Sven, Van Espen, Pierre J., Walczak, Beata

Volltext

Spatial Sign Preprocessing:  A Simple Way To Impart Moderate Robustness to Multivariate Estimators von Serneels, Sven, De Nolf, Evert, Van Espen, Pierre J

Volltext

Bootstrap confidence intervals for trilinear partial least squares regression von Serneels, Sven, Van Espen, Pierre J.

Volltext

Identification of micro-organisms by dint of the electronic nose and trilinear partial least squares regression von Serneels, Sven, Moens, Maarten, Van Espen, Pierre J, Blockhuys, Frank

Volltext

Calculation of PLS prediction intervals using efficient recursive relations for the Jacobian matrix von Serneels, Sven, Lemberge, Pascal, Van Espen, Pierre J.

Volltext

Influence properties of trilinear partial least squares regression von Serneels, Sven, Geladi, Paul, Moens, Maarten, Blockhuys, Frank, Van Espen, Pierre J.

Volltext

General approach for quantitative energy dispersive x-ray fluorescence analysis based on fundamental parameters von He, Fei, Van Espen, Pierre J

Volltext

Case specific prediction intervals for tri-PLS1: The full local linearisation von Serneels, Sven, Faber, Klaas, Verdonck, Tim, Van Espen, Pierre J.

Volltext

Automated Particle Analysis of Populations of Silver Halide Microcrystals by Electron Probe Microanalysis under Cryogenic Conditions von Gregory, Caroline L, Nullens, Henri A, Gijbels, Renaat H, Van Espen, Pierre J, Geuens, Ingrid, De Keyzer, René

Volltext

Robust continuum regression von Serneels, Sven, Filzmoser, Peter, Croux, Christophe, Van Espen, Pierre J.

Volltext

Influence properties of partial least squares regression von Serneels, Sven, Croux, Christophe, Van Espen, Pierre J.

Volltext

Enrichment of trace elements in remote aerosols von Adams, Fred C, Van Craen, Marc J, Van Espen, Pierre J

Volltext

Erratum to “Influence properties of partial least squares regression” [Chemometr. Intell. Lab. Syst. 71 (2004) 13–20] von Serneels, Sven, Croux, Christophe, Van Espen, Pierre J.

Volltext

Quantitative analysis of 16-17th century archaeological glass vessels using PLS regression of EPXMA and µ-XRF data von Lemberge, Pascal, De Raedt, Ine, Janssens, Koen H., Wei, Fuzhong, Van Espen, Pierre J.

Volltext

Robust Multivariate Methods: The Projection Pursuit Approach von Filzmoser, Peter, Serneels, Sven, Croux, Christophe, Van Espen, Pierre J.

Volltext

The Partial Robust M-approach von Serneels, Sven, Croux, Christophe, Filzmoser, Peter, Van Espen, Pierre J.

Volltext

Quantitative analysis of 16-17th century archaeological glass vessels using PLS regression of EPXMA and? -XRF data von Lemberge, Pascal, De Raedt, Ine, Janssens, Koen H., Wei, Fuzhong, Van Espen, Pierre J.

Volltext

Sources and composition of aerosol from Khartoum, Sudan von Eltayeb, Mohamed A.H., Xhoffer, Chris F., Van Espen, Pierre J., Van Grieken, RenéE., Maenhaut, Willy

Volltext