Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis von Pouget, V., Jonathas, S., Job, R., Vaillé, J.R., Wrobel, F., Saigné, F.

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Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit for LEO Space Applications von Secondo, R., Alia, R. Garcia, Peronnard, P., Brugger, M., Masi, A., Danzeca, S., Merlenghi, A., Vaille, J. R., Dusseau, L.

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Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation von Privat, A., Touboul, A. D., Petit, M., Huselstein, J. J., Wrobel, F., Forest, F., Vaillé, J. R., Bourdarie, S., Arinero, R., Chatry, N., Chaumont, G., Lorfèvre, E., Saigné, F.

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Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model von Guetarni, K., Touboul, A.D., Boch, J., Foro, L., Privat, A., Michez, A., Vaillé, J.R., Saigné, F.

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Effect of Ion Energy on Power MOSFET's Oxide Reliability von Naceur, M., Touboul, A. D., Vaille, J. R., Lorfevre, E., Bezerra, F., Chaumont, G., Saigne, F.

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Dose Rate Switching Technique on ELDRS-Free Bipolar Devices von Boch, J., Michez, A., Rousselet, M., Dhombres, S., Touboul, A. D., Vaille, J-R, Dusseau, L., Lorfevre, E., Chatry, N., Sukhaseum, N., Saigne, F.

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Study and Modeling of the Impact of TID on the ATREE Response in LM124 Operational Amplifier von Roig, Fabien, Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J.-H, Privat, A., Vaillé, J.-R, Boch, J., Saigné, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., Azais, B.

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Conception of an integrated sensor for the radiation monitoring of the CMS experiment at the large hadron collider von Ravotti, F., Glaser, M., Moll, M., Idri, K., Vaille, J.R., Prevost, H., Dusseau, L.

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System Level Radiation Characterization of a 1U CubeSat Based on CERN Radiation Monitoring Technology von Secondo, R., Garcia Alia, R., Peronnard, P., Brugger, M., Masi, A., Danzeca, S., Merlenghi, A., Chesta, E., Vaille, J. R., Bernard, M., Dusseau, L.

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Correlation of In-Flight Displacement Damage on the OSL Sensor With Space Environment On-Board Jason-2 Spacecraft von Bourdarie, S., Falguere, D., Inguimbert, C., Deneau, C., Vaillé, J.-R, Lorfèvre, E., Ecoffet, R.

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Modeling and Investigations on TID-ASETs Synergistic Effect in LM124 Operational Amplifier From Three Different Manufacturers von Roig, Fabien, Dusseau, L., Khachatrian, A., Roche, N. J.-H, Privat, A., Vaille, J.-R, Boch, J., Warner, J. H., Saigne, F., Buchner, S. P., McMorrow, D., Ribeiro, P., Auriel, G., Azais, B., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R.

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The Living With a Star Space Environment Testbed Payload von Dyer, C. S., Ryden, K. A., Morris, P. A., Hands, A. D. P., McNulty, P. J., Vaille, J. -R., Dusseau, L., Cellere, G., Paccagnella, A., Barnaby, H. J., Benedetto, A. R., Velazco, R., Bastos, R. Possamai, Brewer, D., Barth, J. L., LaBel, K. A., Campola, M. J., Zheng, Y., Xapsos, M. A.

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Benchmarking Ionizing Space Environment Models von Bourdarie, S., Inguimbert, C., Standarovski, D., Vaille, J.-R, Sicard-Piet, A., Falguere, D., Ecoffet, R., Poivey, C., Lorfevre, E.

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Criterion for SEU occurrence in SRAM deduced from circuit and device Simulations in case of neutron-induced SER von Merelle, T., Chabane, H., Palau, J.-M., Castellani-Coulie, K., Wrobel, F., Saigne, F., Sagnes, B., Boch, J., Vaille, J.R., Gasiot, G., Roche, P., Palau, M.-C., Carriere, T.

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Study of a Thermal Annealing Approach for Very High Total Dose Environments von Dhombres, S., Michez, A., Boch, J., Saigne, F., Beauvivre, S., Kraehenbuehl, D., Vaille, J.-R, Adell, P. C., Lorfevre, E., Ecoffet, R., Roig, F.

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Embedded silicon detector to investigate the natural radiative environment von Pantel, D, Vaille, J R, Wrobel, F, Dilillo, L, Galliere, J M, Autran, J L, Cocquerez, P, Chadoutaud, P, Saigne, F

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The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier von Roig, Fabien, Dusseau, L., Ribeiro, P., Auriel, G., Roche, N. J.-H, Privat, A., Vaille, J.-R, Boch, J., Saigne, F., Marec, R., Calvel, P., Bezerra, F., Ecoffet, R., Azais, B.

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Quality control of intensity modulated radiation therapy with optically stimulated luminescent films von Idri, K., Santoro, L., Charpiot, E., Herault, J., Costa, A., Ailleres, N., Delard, R., Vaille, J.R., Fesquet, J., Dusseau, L.

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Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET von Michez, A., Boch, J., Dhombres, S., Saigné, F., Touboul, A.D., Vaillé, J.-R., Dusseau, L., Lorfèvre, E., Ecoffet, R.

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First In-Flight Data Analysis of Displacement Damage on the OSL Sensor On-Board CARMEN-2 von Deneau, C, Vaille, J-R, Dusseau, L, Mekki, J, Garcia, P, Bezerra, F, Lorfevre, E, Ecoffet, R

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