Modeling of light-induced degradation due to Cu precipitation in p-type silicon. II. Comparison of simulations and experiments von Vahlman, H., Haarahiltunen, A., Kwapil, W., Schön, J., Inglese, A., Savin, H.

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Modeling of light-induced degradation due to Cu precipitation in p-type silicon. I. General theory of precipitation under carrier injection von Vahlman, H., Haarahiltunen, A., Kwapil, W., Schön, J., Inglese, A., Savin, H.

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Impact of copper on light-induced degradation in Czochralski silicon PERC solar cells von Modanese, C., Wagner, Mt, Wolny, F., Oehlke, A., Laine, H.S., Inglese, A., Vahlman, H., Yli-Koski, M., Savin, H.

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Rapid thermal anneal activates light induced degradation due to copper redistribution von Nampalli, N., Laine, H. S., Colwell, J., Vähänissi, V., Inglese, A., Modanese, C., Vahlman, H., Yli-Koski, M., Savin, H.

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Evaluation of Inline High-Intensity Illumination Treatments against LeTID von Vahlman, H, Roder, S, Krauß, K, Nekarda, J, Rein, S

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LeTID mitigation via an adapted firing process in p-type PERC cells from SMART cast-monocrystalline, Czochralski and high-performance multicrystalline silicon von Maischner, F, Maus, S, Greulich, J, Lohmüller, S, Lohmüller, E, Saint-Cast, P, Ourinson, D, Vahlman, H, Hergert, K, Riepe, S, Glunz, S, Rein, S

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