Fabrication of diamond diffraction gratings for experiments with intense hard x-rays von Makita, M., Karvinen, P., Guzenko, V.A., Kujala, N., Vagovic, P., David, C.

Volltext

Hard x-ray multi-projection imaging for single-shot approaches von Villanueva-Perez, P., Pedrini, B., Mokso, R., Vagovic, P., Guzenko, V. A., Leake, S. J., Willmott, P. R., Oberta, P., David, C., Chapman, H. N., Stampanoni, M.

Volltext

Experimental 3D coherent diffractive imaging from photon-sparse random projections von Giewekemeyer, K, Aquila, A, Loh, N-T D, Chushkin, Y, Shanks, K S, Weiss, J T, Tate, M W, Philipp, H T, Stern, S, Vagovic, P, Mehrjoo, M, Teo, C, Barthelmess, M, Zontone, F, Chang, C, Tiberio, R C, Sakdinawat, A, Williams, G J, Gruner, S M, Mancuso, A P

Volltext

Laboratory-based multi-modal X-ray microscopy and micro-CT with Bragg magnifiers von Vagovič, P, Korytár, D, Cecilia, A, Hamann, E, Baumbach, T, Pelliccia, D

Volltext

Advances in indirect detector systems for ultra high-speed hard X-ray imaging with synchrotron light von Olbinado, M.P., Grenzer, J., Pradel, P., Resseguier, T. De, Vagovic, P., Zdora, M.-C., Guzenko, V.A., David, C., Rack, A.

Volltext

Broadband X-ray edge-enhancement imaging of a boron fibre on lithium fluoride thin film detector von Nichelatti, E., Bonfigli, F., Vincenti, M.A., Cecilia, A., Vagovič, P., Baumbach, T., Montereali, R.M.

Volltext

LPE grown LSO:Tb scintillator films for high-resolution X-ray imaging applications at synchrotron light sources von Cecilia, A., Rack, A., Douissard, P.-A., Martin, T., dos Santos Rolo, T., Vagovič, P., Hamann, E., van de Kamp, T., Riedel, A., Fiederle, M., Baumbach, T.

Volltext

Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging von Korytár, D., Vagovič, P., Végsö, K., Šiffalovič, P., Dobročka, E., Jark, W., Áč, V., Zápražný, Z., Ferrari, C., Cecilia, A., Hamann, E., Mikulík, P., Baumbach, T., Fiederle, M., Jergel, M.

Volltext

Coherent Hard X-ray Multiprojection Imaging von Villanueva-Perez, P., Pedrini, B., Mokso, R., Vagovic, P., Guzenko, V., Leake, S., Willmott, P. R., David, C., Chapman, H. N., Stampanoni, M.

Volltext

Coherence preservation and beam flatness of a single-bounce multilayer monochromator (beamline ID19—ESRF) von Rack, A., Weitkamp, T., Zanette, I., Morawe, Ch, Vivo Rommeveaux, A., Tafforeau, P., Cloetens, P., Ziegler, E., Rack, T., Cecilia, A., Vagovič, P., Harmann, E., Dietsch, R., Riesemeier, H.

Volltext

In-line X-ray lensless imaging with lithium fluoride film detectors von Bonfigli, F., Cecilia, A., Bateni, S. Heidari, Nichelatti, E., Pelliccia, D., Somma, F., Vagovic, P., Vincenti, M.A., Baumbach, T., Montereali, R.M.

Volltext

Multi-contrast computed laminography at ANKA light source von Cheng, Y, Altapova, V, Helfen, L, Xu, F, dos Santos Rolo, T, Vagovič, P, Fiederle, M, Baumbach, T

Volltext

Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments von Danilewsky, A. N., Wittge, J., Hess, A., Cröll, A., Rack, A., Allen, D., McNally, P., dos Santos Rolo, T., Vagovič, P., Baumbach, T., Garagorri, J., Elizalde, M. R., Tanner, B. K.

Volltext

Linearly graded GeSi beam-expanding/compressing X-ray monochromator von Korytár, D., Ferrari, C., Mikulík, P., Vagovič, P., Dobročka, E., Áč, V., Konopka, P., Erko, A., Abrosimov, N.

Volltext

Development towards high-resolution kHz-speed rotation-free volumetric imaging von Asimakopoulou, Eleni Myrto, Bellucci, Valerio, Birnsteinova, Sarlota, Yao, Zisheng, Zhang, Yuhe, Petrov, Ilia, Deiter, Carsten, Mazzolari, Andrea, Romagnoni, Marco, Korytar, Dusan, Zaprazny, Zdenko, Kuglerova, Zuzana, Juha, Libor, Lukić, Bratislav, Rack, Alexander, Samoylova, Liubov, Garcia-Moreno, Francisco, Hall, Stephen A, Neu, Tillmann, Liang, Xiaoyu, Vagovic, Patrik, Villanueva-Perez, Pablo

Volltext

X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers von Tanner, B.K., Wittge, J., Vagovič, P., Baumbach, T., Allen, D., McNally, P.J., Bytheway, R., Jacques, D., Fossati, M.C., Bowen, D.K., Garagorri, J., Elizalde, M.R., Danilewsky, A.N.

Volltext

Characterisation of LSO:Tb scintillator films for high resolution X-ray imaging applications von Cecilia, A., Rack, A., Douissard, P.-A., Martin, T., dos Santos Rolo, T., Vagovič, P., Pelliccia, D., Couchaud, M., Dupré, K., Baumbach, T.

Volltext

Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography von Danilewsky, A., Wittge, J., Hess, A., Cröll, A., Allen, D., McNally, P., Vagovič, P., Cecilia, A., Li, Z., Baumbach, T., Gorostegui-Colinas, E., Elizalde, M.R.

Volltext

Investigation of crystallographic and detection properties of CdTe at the ANKA synchrotron light source von Cecilia, A, Hamann, E, Haas, C, Greiffenberg, D, Danilewsky, A, Haenscke, D, Fauler, A, Zwerger, A, Buth, G, Vagovic, P, Baumbach, T, Fiederle, M

Volltext

X-ray Bragg magnifier microscope as a linear shift invariant imaging system: image formation and phase retrieval von Vagovič, P, Svéda, L, Cecilia, A, Hamann, E, Pelliccia, D, Gimenez, E N, Korytár, D, Pavlov, K M, Zápražný, Z, Zuber, M, Koenig, T, Olbinado, M, Yashiro, W, Momose, A, Fiederle, M, Baumbach, T

Volltext