A new era of crystallization: advances in polysilicon crystallization and crystal engineering von Voutsas, A.T.

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Hydrogen passivation on Sequential Lateral Solidified poly-Si TFTs von Michalas, L., Koutsoureli, M., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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Parametric investigation of SLS-processed poly-silicon thin films for TFT applications von Crowder, M.A., Moriguchi, M., Mitani, Y., Voutsas, A.T.

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Effect of process parameters on the structural characteristics of laterally grown, laser-annealed polycrystalline silicon films von Voutsas, A. T., Limanov, A., Im, J. S.

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Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress von Michalas, L., Papaioannou, G.J., Voutsas, A.T.

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Back gate influence on front channel operation of p-channel double gate polysilicon TFTs von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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On the study of p-channel thin-film transistors fabricated by SLS ELA crystallization techniques von Exarchos, M.A., Moschou, D.C., Papaioannou, G.J., Kouvatsos, D.N., Arapoyanni, A., Voutsas, A.T.

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Raman spectroscopy of amorphous and microcrystalline silicon films deposited by low-pressure chemical vapor deposition von Voutsas, A. T., Hatalis, M. K., Boyce, J., Chiang, A.

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Effect of silicon thickness on the degradation mechanisms of sequential laterally solidified polycrystalline silicon TFTs during hot-carrier stress von Voutsas, A.T., Kouvatsos, D.N., Michalas, L., Papaioannou, G.J.

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A novel SLS ELA crystallization process and its effects on polysilicon film defectivity and TFT performance von Moschou, Despina C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.

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Assessment of the performance of laser-based lateral-crystallization technology via analysis and modeling of polysilicon thin-film-transistor mobility von Voutsas, A.T.

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Characterization of thin film transistors fabricated on different sequential lateral solidified poly-silicon substrates von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Farmakis, F.V., Voutsas, A.T.

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The role of structural defects and texture variability in the performance of poly-Si thin film transistors von Voutsas, A.T.

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Performance of thin-film transistors fabricated by sequential lateral solidification crystallization techniques von Exarchos, M. A., Moschou, D. C., Papaioannou, G. J., Kouvatsos, D. N., Voutsas, A. T.

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A temperature study of photosensitivity in SLS polycrystalline silicon TFTs von Michalas, L., Syntychaki, A., Koutsoureli, M., Papaioannou, G.J., Voutsas, A.T.

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Design and fabrication of high-performance polycrystalline silicon thin-film transistor circuits on flexible steel foils von Afentakis, T., Hatalis, M., Voutsas, A.T., Hartzell, J.

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Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors von Davidović, V., Kouvatsos, D.N., Stojadinović, N., Voutsas, A.T.

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Device degradation behavior and polysilicon film morphology of thin film transistors fabricated using advanced excimer laser lateral solidification techniques von Kouvatsos, D.N., Voutsas, A.T., Michalas, L., Farmakis, F.V., Papaioannou, G.J.

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Investigation of the undershoot effect in polycrystalline silicon thin film transistors von Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.

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Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors von KOUVATSOS, D. N, DAVIDOVIC, V, PAPAIOANNOU, G. J, STOJADINOVIC, N, MICHALAS, L, EXARCHOS, M, VOUTSAS, A. T, GOUSTOURIDIS, D

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