The National Ballistics Imaging Comparison (NBIC) project von Song, J, Vorburger, T.V, Ballou, S, Thompson, R.M, Yen, J, Renegar, T.B, Zheng, A, Silver, R.M, Ols, M

Volltext

Contribution of CIRP to the Development of Metrology and Surface Quality Evaluation during the last fifty years von Peters, J., Bryan, J.B., Estler, W.T., Evans, C., Kunzmann, H., Lucca, D.A., Sartori, S., Sato, H., Thwaite, E.G., Vanherck, P., Hocken, R.J., Peklenik, J., Pfeifer, T., Trumpold, H., Vorburger, T.V.

Volltext

Applications of cross-correlation functions von Vorburger, T.V., Song, J.-F., Chu, W., Ma, L., Bui, S.H., Zheng, A., Renegar, T.B.

Volltext

The effect of tip size on the measured Ra of surface roughness specimens with rectangular profiles von Song, J., Renegar, T.B., Soons, J., Muralikrishnan, B., Villarrubia, J., Zheng, A., Vorburger, T.V.

Volltext

Applications of surface metrology in firearm identification von Zheng, X, Soons, J, Vorburger, T V, Song, J, Renegar, T, Thompson, R

Volltext

The Second National Ballistics Imaging Comparison (NBIC-2) von Vorburger, T V, Yen, J, Song, J F, Thompson, R M, Renegar, T B, Zheng, A, Tong, M, Ols, M

Volltext

Regimes of surface roughness measurable with light scattering von Vorburger, T V, Marx, E, Lettieri, T R

Volltext

Establishing a Traceability and Quality System for U.S. Ballistics Identification Using NIST SRM Standard Bullets and Cartridge Cases von Song, J., Thompson, R., Vorburger, T.V., Ballou, S., Yen, J., Renegar, T., Zheng, A., Silver, R., Ols, M.

Volltext

A fast algorithm for determining the Gaussian filtered mean line in surface metrology von Yuan, Y.-B., Qiang, X.-F., Song, J.-F., Vorburger, T.V.

Volltext

Standards for bullets and casings von Song, J.F, Vorburger, T.V, Clary, R, Whitenton, E, Ma, L, Ballou, S

Volltext

Photoelectron spectra of the decomposition of ethylene on (110) tungsten von Plummer, E.W., Waclawski, B.J., Vorburger, T.V.

Volltext

Optical measurement of the roughness of sinusoidal surfaces von Vorburger, T.V., Gilsinn, D.E., Scire, F.E., McLay, M.J., Giauque, C.H.W., Teague, E.C.

Volltext

Industrial uses of STM and AFM von Vorburger, T.V., Dagata, J.A., Wilkening, G., Iizuka, K.

Volltext

Measurements of Roughness of very Smooth Surfaces 1 1Contribution of the U. S. National Bureau of Standards, not subject to copyright, except for Figures 2-10 and 15, reprinted wit... von Vorburger, T.V., Hocken, R.J.

Volltext

Measurements of Roughness of very Smooth Surfaces 1 1 Contribution of the U. S. National Bureau of Standards, not subject to copyright, except for Figures 2-10 and 15, reprinted wi... von Vorburger, T.V., Hocken, R.J.

Volltext

Industrial Uses of STM and AFM Contribution of the National Institute of Standards and Technology. Not subject to copyright except for illustrations taken from other sources von Vorburger, T.V., Dagata, J.A., Wilkening, G., Lizuka, K., Thwaite, E.G., Lonardo, P.

Volltext

Optical techniques for on-line measurement of surface topography von Vorburger, T.V., Teague, E.C.

Volltext

Problems in surface metrology von Vorburger, T.V., Dixson, R.G., Tsai, V., Doi, T., Song, J.F., Renegar, T.B., Fu, J.

Volltext

Comparison between precision roughness master specimens and their electroformed replicas von Song, J.F., Vorburger, T.V., Rubert, P.

Volltext

The measurement and uncertainty of a calibration standard for the scanning electron microscope von FU, J, CROARKIN, M. C, VORBURGER, T. V

Volltext