18O(p,α)15N isotopic tracing of germanium diffusion in SiO2/Si films von Nélis, A., Vickridge, I., Ganem, J.-J., Briand, E., Terwagne, G.

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Determination and benchmarking of 27Al(d,α) and 27Al(d,p) reaction cross sections for energies and angles relevant to NRA von Salimi, M., Kakuee, O., Masoudi, S. F., Rafi-kheiri, H., Briand, E., Ganem, J.-J., Vickridge, I.

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Tracer study of pore initiation in anodic alumina formed in phosphoric acid von Baron-Wiecheć, A., Burke, M.G., Hashimoto, T., Liu, H., Skeldon, P., Thompson, G.E., Habazaki, H., Ganem, J.-J., Vickridge, I.C.

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Film growth and alloy enrichment during anodizing AZ31 magnesium alloy in fluoride/glycerol electrolytes of a range of water contents von Němcová, A., Galal, O., Skeldon, P., Kuběna, I., Šmíd, M., Briand, E., Vickridge, I., Ganem, J-J., Habazaki, H.

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Kinetics and mechanisms of iron redox reactions in silicate melts: The effects of temperature and alkali cations von Magnien, V., Neuville, D.R., Cormier, L., Roux, J., Hazemann, J.-L., de Ligny, D., Pascarelli, S., Vickridge, I., Pinet, O., Richet, P.

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Anodic film growth and silver enrichment during anodizing of an Mg-0.6 at.% Ag alloy in fluoride-containing organic electrolytes von Němcová, A., Li, Y., Kuběna, I., Vickridge, I., Ganem, J.-J., Yerokhin, A., Habazaki, H., Skeldon, P.

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Growth of SiO2 on SiC by dry thermal oxidation: mechanisms von Vickridge, I, Ganem, J, Hoshino, Y, Trimaille, I

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Rutherford Backscattering Spectrometry analysis of iron-containing Bi2Se3 topological insulator thin films von Alarcon-Diez, V., Eddrief, M., Vickridge, I.

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Development of a reference database for Ion Beam Analysis and future perspectives von Abriola, D., Barradas, N.P., Bogdanović-Radović, I., Chiari, M., Gurbich, A.F., Jeynes, C., Kokkoris, M., Mayer, M., Ramos, A.R., Shi, L., Vickridge, I.

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Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling von Barradas, N.P., Mateus, R., Fonseca, M., Reis, M.A., Lorenz, K., Vickridge, I.

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Ferromagnetism in Ga0.90Mn0.10As1―yPy: From the metallic to the impurity band conduction regime von CUBUKCU, M, VON BARDELEBEN, H. J, CANTIN, J. L, VICKRIDGE, I, LEMAITRE, A

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Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors von Naresh-Kumar, G., Vilalta-Clemente, A., Pandey, S., Skuridina, D., Behmenburg, H., Gamarra, P., Patriarche, G., Vickridge, I., di Forte-Poisson, M. A., Vogt, P., Kneissl, M., Morales, M., Ruterana, P., Cavallini, A., Cavalcoli, D., Giesen, C., Heuken, M., Trager-Cowan, C.

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Influence of substrate temperature on growth of nanocrystalline silicon carbide by reactive magnetron sputtering von Colder, H., Rizk, R., Morales, M., Marie, P., Vicens, J., Vickridge, I.

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Direct measurement of molecular breakup dynamics and vicinage effect of swift proton clusters using narrow nuclear resonance profiling von L’Hoir, A., Ganem, J.J., Trimaille, I., Vickridge, I.C.

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Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study von Seah, M. P., Spencer, S. J., Bensebaa, F., Vickridge, I., Danzebrink, H., Krumrey, M., Gross, T., Oesterle, W., Wendler, E., Rheinländer, B., Azuma, Y., Kojima, I., Suzuki, N., Suzuki, M., Tanuma, S., Moon, D. W., Lee, H. J., Cho, Hyun Mo, Chen, H. Y., Wee, A. T. S., Osipowicz, T., Pan, J. S., Jordaan, W. A., Hauert, R., Klotz, U., van der Marel, C., Verheijen, M., Tamminga, Y., Jeynes, C., Bailey, P., Biswas, S., Falke, U., Nguyen, N. V., Chandler-Horowitz, D., Ehrstein, J. R., Muller, D., Dura, J. A.

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The carbon and hydrogen contents in ALD-grown ZnO films define a narrow ALD temperature window von Xia, B., Ganem, J.J., Briand, E., Steydli, S., Tancrez, H., Vickridge, I.

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Size-dependent thermo-optical properties of embedded Bi nanostructures von Haro-Poniatowski, E, Serna, R, Jiménez de Castro, M, Suárez-García, A, Afonso, C N, Vickridge, I

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Two and/or three dimensional Au nano-clusters on oxide supports analyzed by high-resolution ion scattering von Iwamoto, A., Okazawa, T., Akita, T., Vickridge, I., Kido, Y.

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Characterization and optimization of magnetron sputtered Sc/Si multilayers for extreme ultraviolet optics von GAUTIER, J, DELMOTTE, F, BRIDOU, F, RAVET, M. F, VARNIERE, F, ROULLIAY, M, JEROME, A, VICKRIDGE, I

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RBS and NRA analysis for films with high growth rate prepared by atomic layer deposition von Xia, B., Ganem, J.J., Steydli, S., Tancrez, H., Vickridge, I.

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