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    Measuring electrical values of discrete semiconductor components - by varying reference value until minimal discrepancy is obtained

    Measuring electrical values of discrete semiconductor components - by varying reference value until minimal discrepancy is obtained von VASENSZKY,FERENC, SZTANKO,JOZSEF, PALFALVI,GYOEZOE, SZEKELY,GYOERGY, MALIK,SANDOR

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    METHOD AND CIRCUIT ARRANGEMENT FOR MEASURING THE PARAMETERS OF ELECTRICAL COMPONENT PARTS,PREFERABLY THOSE OF SEMICONDUCTOR DEVICES

    METHOD AND CIRCUIT ARRANGEMENT FOR MEASURING THE PARAMETERS OF ELECTRICAL COMPONENT PARTS,PREFERABLY THOSE OF SEMICONDUCTOR DEVICES von SZEKELY,GYOERGY,HU, SZTANKO,JOZSEF,HU, VASENSZKY,FERENC,HU, PALFALVI,GYOEZOE,HU, MALIK,SANDOR,HU

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