Numerical determination of the local ordering of PbMg1/3Nb2/3O3 (PMN) from high resolution electron microscopy images von BOULESTEIX, C, VARNIER, F, LLEBARIA, A, HUSSON, E

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Morphology and structure of Tio2 thin layers vs. thickness and substrate temperature von LOTTIAUX, M, BOULESTEIX, C, NIHOUL, G, VARNIER, F, FLORY, F, GALINDO, R, PELLETIER, E

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Statistical parameters for random and pseudorandom rough surfaces von Rasigni, G., Llebaria, A., Rasigni, M., Palmari, J., Dussert, C., Varnier, F.

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Experimental study of the relationships between the near-normal reflectance, the optical constants, and the roughness of thin silver films von Mayani, N., Varnier, F., Rasigni, G.

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Study of the surface roughness for thin films of LiF and Ag/LiF von Varnier, F., Mayani, N., Rasigni, G., Rasigni, M., Llebaria, A.

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Microdensitometer analysis of electron micrographs of shadowed surface replicas: A powerful method in surface structure characterization von Rasigni, G., Rasigni, M., Varnier, F., Palmari, J., Palmari, J.P., Llebaria, A.

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Study of surface roughness for thin films of CaF2 deposited on glass substrates von RASIGNI, G, VARNIER, F, PALMARY, J. P, MAYANI, N, RASIGNI, M, LLEBARIA, A

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Influence of some parameters on the surface profile restored from microdensitometer analysis of electron micrographs of surface replicas von Varnier, F, Rasigni, G, Palmari, J P, Llebaria, A, Rasigni, M

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Quantitative characterization of a biological membrane by means of its spatial autocovariance von Rasigni, G., Palmari, J., Rasigni, M., Varnier, F., Palmari, J.P., Marty, F., Llebaria, A.

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Height and slope distributions for surfaces of rough metallic deposits von Varnier, F, Rasigni, M, Rasigni, G, Palmari, J P, Llebaria, A

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Roughness spectrum for surfaces of silver deposits von Rasigni, G., Varnier, F., Rasigni, M., Palmari, J.P., Llebaria, A.

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Roughness spectrum and surface plasmons for surfaces of silver, copper, gold, and magnesium deposits von Rasigni, G., Varnier, F., Rasigni, M., Palmari, J. P., Llebaria, A.

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Autocovariance functions, root-mean-square-roughness height, and autocovariance length for rough deposits of copper, silver, and gold von Rasigni, G., Varnier, F., Rasigni, M., Palmari, J. P., Llebaria, A.

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Higher-order moments for profiles of statistically rough, real surfaces von RASIGNI, G, VARNIER, F, RASIGNI, M

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Numerical determination of the local ordering of PbMg[sub 1/3]Nb[sub 2/3]O[sub 3] (PMN) from high resolution electron microscopy images von Boulesteix, C., Varnier, F., Llebaria, A., Husson, E.

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Numerical Determination of the Local Ordering of PbMg 1/3Nb 2/3O 3 (PMN) from High Resolution Electron Microscopy Images von Boulesteix, C., Varnier, F., Llebaria, A., Husson, E.

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Statistical parameters for rough surfaces of thin films of CaF(2) and Ag/CaF(2) von Varnier, F, Mayani, N, Rasigni, G

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Morphology and structure of TiO 2 thin layers vs. thickness and substrate temperature von Lottiaux, M., Boulesteix, C., Nihoul, G., Varnier, F., Flory, F., Galindo, R., Pelletier, E.

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Effect of Dispersion Forces on the Adhesion of Continuous Metallic Films on Amorphous Carbon or Silicon Substrates von Desrousseaux, G, Carlan, A, Varnier, F

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Relation between optical scattering, microstructure and topography of thin silver films. 1: Optical scattering and topography von Bennett, J M, Hurt, H H, Rahn, J P, Elson, J M, Guenther, K H, Rasigni, M, Varnier, F

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