Optical Gain in Commercial Laser Diodes von Vanzi, Massimo

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Chip and package-related degradation of high power white LEDs von Meneghini, Matteo, Dal Lago, Matteo, Trivellin, Nicola, Mura, Giovanna, Vanzi, Massimo, Meneghesso, Gaudenzio, Zanoni, Enrico

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Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes von De Santi, Carlo, Meneghini, Matteo, Gachet, David, Mura, Giovanna, Vanzi, Massimo, Meneghesso, Gaudenzio, Zanoni, Enrico

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Thermal and electrical investigation of the reverse bias degradation of silicon solar cells von Compagnin, Alessandro, Meneghini, Matteo, Barbato, Marco, Giliberto, Valentina, Cester, Andrea, Vanzi, Massimo, Mura, Giovanna, Zanoni, Enrico, Meneghesso, Gaudenzio

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Editorial von Vanzi, Massimo

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Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices von Tomm, Jens W., Kernke, Robert, Mura, Giovanna, Vanzi, Massimo, Hempel, Martin, Acklin, Bruno

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Analysis of GaN based high‐power diode lasers after singular degradation events von Mura, Giovanna, Vanzi, Massimo, Hempel, Martin, Tomm, Jens W.

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Extended Modal Gain Measurement in DFB Laser Diodes von Vanzi, Massimo, Marcello, Giulia, Mura, Giovanna, Le Gales, Germain, Joly, Simon, Deshayes, Yannick, Bechou, Laurent

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Extended modal gain measurement in DFB Laser diodes von Vanzi, Massimo, Marchello, Gulia, Mura, Giovanna, Bechou, Laurent, Deshayes, Yannick, Le Gales, Germain, Joly, Simon

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Practical optical gain by an extended Hakki-Paoli method von Vanzi, Massimo, Marcello, Gulia, Mura, Giovanna, Le Gales, Germain, Joly, Simon, Deshayes, Yannick, Bechou, Laurent

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Practical optical gain by an extended Hakki-Paoli method von Vanzi, M., Marcello, G., Mura, G., Le Galès, G., Joly, S., Deshayes, Y., Bechou, L.

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High-Resolution Cathodoluminescence Investigation of Degradation Processes in InGaN Green Laser Diodes von Gachet, David, de Santi, Carlo, Meneghini, Matteo, Mura, Giovanna, Vanzi, Massimo, Meneghesso, Gaudenzio, Zanoni, Enrico

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An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy von Pintus, R., Podda, S., Vanzi, M.

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Electron holography of long-range electric and magnetic fields von MATTEUCCI, G, MISSIROLI, G, NICHELATTI, E, MIGLIORI, A, VANZI, M, POZZI, G

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Chip and package-related degradation of high power white LEDs: Reliability of High-Power LED Packaging and Assembly von MENEGHINI, Matteo, DAL LAGO, Matteo, TRIVELLIN, Nicola, MURA, Giovanna, VANZI, Massimo, MENEGHESSO, Gaudenzio, ZANONI, Enrico

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Video Streaming in Electron Microscopy Applications von Mighela, Francesca, Perra, Cristian, Vanzi, Massimo

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Implementation of a "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment von Spezzigu, P., Caddeo, C., Quadri, G., Gilard, O., Bechou, L., Ousten, Y., Vanzi, M.

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Editorial von Fantini, Fausto, Vanzi, Massimo

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A physically based mobility model for numerical simulation of nonplanar devices von Lombardi, C., Manzini, S., Saporito, A., Vanzi, M.

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Image alignment for 3D reconstruction in a SEM von Pintus, Ruggero, Podda, Simona, Vanzi, Massimo

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