Phosphors for LED-based light sources: Thermal properties and reliability issues von Dal Lago, M., Meneghini, M., Trivellin, N., Mura, G., Vanzi, M., Meneghesso, G., Zanoni, E.

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Optical losses in single-mode laser diodes von Vanzi, M., Mura, G., Marongiu, M., Tomasi, T.

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The role of the optical trans-characteristics in laser diode analysis von Mura, G., Vanzi, M., Marcello, G., Cao, R.

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Peculiar failure mechanisms in GaN power transistors von Vanzi, M., Mura, G.

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FIB-induced electro-optical alterations in a DFB InP laser diode von Mura, G., Vanzi, M., Marcello, G.

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XEBIC at the Dual Beam von Vanzi, M., Podda, S., Musu, E., Cao, R.

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The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis von Mura, G., Vanzi, M.

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DC parameters for laser diodes from experimental curves von Vanzi, M., Mura, G., Martines, G.

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Failure Analysis-assisted FMEA von Cassanelli, G., Mura, G., Fantini, F., Vanzi, M., Plano, B.

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Sulfur-contamination of high power white LED von Mura, G., Cassanelli, G., Fantini, F., Vanzi, M.

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“Hot-plugging” of LED modules: Electrical characterization and device degradation von Dal Lago, M., Meneghini, M., Trivellin, N., Mura, G., Vanzi, M., Meneghesso, G., Zanoni, E.

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Lot reliability issues in commercial off the shelf (COTS) microelectronic devices von Mura, G., Vanzi, M.

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An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy von Pintus, R., Podda, S., Vanzi, M.

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Further improvements of an extended Hakki-Paoli method von Vanzi, M., Mura, G., Martines, G.

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High brightness GaN LEDs degradation during dc and pulsed stress von Meneghini, M., Podda, S., Morelli, A., Pintus, R., Trevisanello, L., Meneghesso, G., Vanzi, M., Zanoni, E.

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An original DoE-based tool for silicon photodetectors EoL estimation in space environments von Spezzigu, P., Bechou, L., Quadri, G., Gilard, O., Ousten, Y., Vanzi, M.

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A physically based mobility model for numerical simulation of nonplanar devices von Lombardi, C., Manzini, S., Saporito, A., Vanzi, M.

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Implementation of a "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment von Spezzigu, P., Caddeo, C., Quadri, G., Gilard, O., Bechou, L., Ousten, Y., Vanzi, M.

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Reliability predictions in electronic industrial applications von Cassanelli, G., Mura, G., Cesaretti, F., Vanzi, M., Fantini, F.

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Optical gain in laser diodes with null reflectivity von Vanzi, M., Mura, G., Rampulla, A., Marchetti, R., Sanna Valle, V., Ueno, Y.

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