Absolute flatness measurement using oblique incidence setup and an iterative algorithm A demonstration on synthetic data von Vannoni, Maurizio

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Absolute, high-accuracy characterization of a variable line spacing grating for the European XFEL soft X-ray monochromator von Vannoni, Maurizio, Freijo-Martin, Idoia

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Comparing single‐shot damage thresholds of boron carbide and silicon at the European XFEL von Tavakkoly, Marziyeh, Chalupsky, Jaromir, Hajkova, Vera, Hillert, Wolfgang, Jelinek, Simon, Juha, Libor, Makita, Mikako, Mazza, Tommaso, Meyer, Michael, Montano, Jacobo, Sinn, Harald, Vozda, Vojtech, Vannoni, Maurizio

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The beam transport system for the Small Quantum Systems instrument at the European XFEL: optical layout and first commissioning results von Mazza, Tommaso, Baumann, Thomas M., Boll, Rebecca, De Fanis, Alberto, Grychtol, Patrik, Ilchen, Markus, Montaño, Jacobo, Music, Valerija, Ovcharenko, Yevheniy, Rennhack, Nils, Rivas, Daniel E., Rörig, Aljoscha, Schmidt, Philipp, Usenko, Sergey, Ziołkowski, Pawel, La Civita, Daniele, Vannoni, Maurizio, Sinn, Harald, Keitel, Barbara, Plönjes, Elke, Jastrow, Ulf Fini, Sorokin, Andrey, Tiedtke, Kai, Mann, Klaus, Schäfer, Bernd, Breckwoldt, Niels, Son, Sang-Kil, Meyer, Michael

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X-ray spectrometer based on a bent diamond crystal for high repetition rate free-electron laser applications von Boesenberg, Ulrike, Samoylova, Liubov, Roth, Thomas, Zhu, Diling, Terentyev, Sergey, Vannoni, Maurizio, Feng, Yiping, van Driel, Tim Brandt, Song, Sanghoon, Blank, Vladimir, Sinn, Harald, Robert, Aymeric, Madsen, Anders

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Absolute flatness measurement using oblique incidence setup and an iterative algorithm. A demonstration on synthetic data von Vannoni, Maurizio

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Characterization of an X-ray mirror mechanical bender for the European XFEL von Vannoni, Maurizio, Freijo Martín, Idoia, Sinn, Harald

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Opportunities for Two-Color Experiments in the Soft X-ray Regime at the European XFEL von Serkez, Svitozar, Decking, Winfried, Froehlich, Lars, Gerasimova, Natalia, Grünert, Jan, Guetg, Marc, Huttula, Marko, Karabekyan, Suren, Koch, Andreas, Kocharyan, Vitali, Kot, Yauhen, Kukk, Edwin, Laksman, Joakim, Lytaev, Pavel, Maltezopoulos, Theophilos, Mazza, Tommaso, Meyer, Michael, Saldin, Evgeni, Schneidmiller, Evgeny, Scholz, Matthias, Tomin, Sergey, Vannoni, Maurizio, Wohlenberg, Torsten, Yurkov, Mikhail, Zagorodnov, Igor, Geloni, Gianluca

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Cavity based x-ray free electron laser demonstrator at the European X-ray Free Electron Laser facility von Rauer, Patrick, Decking, Winfried, Lipka, Dirk, Thoden, Daniel, Wohlenberg, Torsten, Bahns, Immo, Brueggmann, Ulf, Casalbuoni, Sara, Di Felice, Massimiliano, Dommach, Martin, Grünert, Jan, Karabekyan, Suren, Koch, Andreas, La Civita, Daniele, Rio, Benoit, Samoylova, Liubov, Sinn, Harald, Vannoni, Maurizio, Youngman, Christopher, Hillert, Wolfgang, Rossbach, Jörg

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Long-term deformation at room temperature observed in fused silica von Vannoni, Maurizio, Sordini, Andrea, Molesini, Giuseppe

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Iterative algorithm for three flat test von Vannoni, Maurizio, Molesini, Giuseppe

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Absolute planarity with three-flat test: an iterative approach with Zernike polynomials von Vannoni, Maurizio, Molesini, Giuseppe

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Three-flat test with plates in horizontal posture von Vannoni, Maurizio, Molesini, Giuseppe

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Cascaded hard X-ray self-seeded free-electron laser at megahertz repetition rate von Liu, Shan, Grech, Christian, Guetg, Marc, Karabekyan, Suren, Kocharyan, Vitali, Kujala, Naresh, Lechner, Christoph, Long, Tianyun, Mirian, Najmeh, Qin, Weilun, Serkez, Svitozar, Tomin, Sergey, Yan, Jiawei, Abeghyan, Suren, Anton, Jayson, Blank, Vladimir, Boesenberg, Ulrike, Brinker, Frank, Chen, Ye, Decking, Winfried, Dong, Xiaohao, Kearney, Steve, La Civita, Daniele, Madsen, Anders, Maltezopoulos, Theophilos, Rodriguez-Fernandez, Angel, Saldin, Evgeni, Samoylova, Liubov, Scholz, Matthias, Sinn, Harald, Sleziona, Vivien, Shu, Deming, Tanikawa, Takanori, Terentiev, Sergey, Trebushinin, Andrei, Tschentscher, Thomas, Vannoni, Maurizio, Wohlenberg, Torsten, Yakopov, Mikhail, Geloni, Gianluca

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Measuring the thickness of soap bubbles with phase-shift interferometry von Vannoni, Maurizio, Sordini, Andrea, Gabrieli, Riccardo, Melozzi, Mauro, Molesini, Giuseppe

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Calibration and optimization of an x-ray bendable mirror using displacement-measuring sensors von Vannoni, Maurizio, Martín, Idoia Freijo, Music, Valerija, Sinn, Harald

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Absolute interferometric characterization of an x-ray mirror surface profile von Vannoni, Maurizio, Martìn, Idoia Freijo

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Simulations about Stability, Damage, and Heating Impacts for an X-ray Optical Delay Line at SASE3 von Tavakkoly, Marziyeh, Grünert, Jan, Koch, Andreas, La Civita, Daniele, Makita, Mikako, Meyer, Michael, Planas, Marc, Serkez, Svitozar, Sinn, Harald, Wohlenberg, Torsten, Vannoni, Maurizio

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Real-time spatial characterization of micrometer-sized X-ray free-electron laser beams focused by bendable mirrors von Mercurio, Giuseppe, Chalupský, Jaromír, Nistea, Ioana-Theodora, Schneider, Michael, Hájková, Věra, Gerasimova, Natalia, Carley, Robert, Cascella, Michele, Le Guyader, Loïc, Mercadier, Laurent, Schlappa, Justine, Setoodehnia, Kiana, Teichmann, Martin, Yaroslavtsev, Alexander, Burian, Tomáš, Vozda, Vojtĕch, Vyšín, Luděk, Wild, Jan, Hickin, David, Silenzi, Alessandro, Stupar, Marijan, Torben Delitz, Jan, Broers, Carsten, Reich, Alexander, Pfau, Bastian, Eisebitt, Stefan, La Civita, Daniele, Sinn, Harald, Vannoni, Maurizio, Alcock, Simon G., Juha, Libor, Scherz, Andreas

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Metrology characterization of ultraprecise bendable mirrors for the European XFEL: from offsite calibration to installation and commissioning von Vannoni, Maurizio, Freijo Martín, Idoia, Smidtchen, Silja, Baumann, Thomas M., Meyer, Michael, Music, Valerija

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