III–nitrides: Growth, characterization, and properties von Jain, S. C., Willander, M., Narayan, J., Overstraeten, R. Van

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Low-cost industrial technologies of crystalline silicon solar cells von Szlufcik, J., Sivoththaman, S., Nlis, J.F., Mertens, R.P., Van Overstraeten, R.

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Critical thickness and strain relaxation in lattice mismatched II–VI semiconductor layers von Pinardi, K., Jain, Uma, Jain, S. C., Maes, H. E., Van Overstraeten, R., Willander, M.

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A method to interpret micro-Raman experiments made to measure nonuniform stresses: Application to local oxidation of silicon structures von Pinardi, K., Jain, S. C., Willander, M., Atkinson, A., Maes, H. E., Van Overstraeten, R.

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Studies on the Relationship between Esophageal Acid Exposure, Mucosal Lesions and Heartburn Using an Acid Exposure Sensor von Vantrappen, G., Tack, J., Huyberechts, G., Sifrim, D., Geboes, K., Janssens, J., Overstraeten, R. Van

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Effect of elastic constants on the stresses in stripes and substrates: a 2D FE calculation von Jain, S C, Pinardi, K, Maes, H E, Overstraeten, R van, Willander, M

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Validation of a new method of measuring esophageal acid exposure: Comparison with 24-hour pH monitoring von TACK, J, VANTRAPPEN, G, HUYBERECHTS, G, SIFRIM, D, JANSSENS, J, VAN OVERSTRAETEN, R

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Impact ionization in silicon: A review and update von Maes, W., De Meyer, K., Van Overstraeten, R.

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Thick-film metallization for solar cell applications von Cheek, G.C., Mertens, R.P., Van Overstraeten, R., Frisson, L.

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Trends in industrial silicon solar cell processes von Ghannam, M., Sivoththaman, S., Poortmans, J., Szlufcik, J., Nijs, J., Mertens, R., Van Overstraeten, R.

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Development of a disposable probe for the evaluation of acid-induced damage of the oesophageal mucosa von Huyberechts, G., Honoré, M., Van Overstraeten, R., Vantrappen, G., Janssens, J., Sifrim, D., Mebis, J., Geboes, K.

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Impact of the transmission line properties of a metal-ultrathin silicon dioxide-semiconductor field-effect transistor on the extracted inversion-layer thickness von Kol’dyaev, V. I., Clerix, A., Deferm, L., Van Overstraeten, R.

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Stress relaxation in laterally small strained semiconductor epilayers von Van Mieghem, P., Jain, S. C., Nijs, J., Van Overstraeten, R.

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Progress in photovoltaic energy conversion von Overstraeten, R Van, Mertens, R, Nijs, J

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Minority carrier recombination in heavily-doped silicon von Tyagi, M.S., Van Overstraeten, R.

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Recent improvements in the screenprinting technology and comparison with the buried contact technology by 2D-simulation von Nijs, J., Demesmaeker, E., Szlufcik, J., Poortmans, J., Frisson, L., De Clercq, K., Ghannam, M., Mertens, R., Van Overstraeten, R.

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Influence of bandgap narrowing on the performance of silicon n- p solar cells von Lauwers, P., Van Meerbergen, J., Bulteel, P., Mertens, R., Van Overstraeten, R.

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Calculation of critical-layer-thickness and strain relaxation in GexSi1-x strained layers with interacting 60 and 90° dislocations von JAIN, U, JAIN, S. C, NIJS, J, WILLIS, J. R, BULLOUGH, R, MERTENS, R. P, VAN OVERSTRAETEN, R

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Energy of arrays of nonperiodic interacting dislocations in semiconductor strained epilayers : implications for strain relaxation von UMA JAIN, JAIN, S. C, ATKINSON, A, NIJS, J, MERTENS, R. P, VAN OVERSTRAETEN, R

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Electrical and optical bandgaps of GexSi1-x strained layers von JAIN, S. C, POORTMANS, J, IYER, S. S, LOFERSKI, J. J, NIJS, J, MERTENS, R, VAN OVERSTRAETEN, R

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