Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation von Chandrasekaran, Anirudhan, van de Kruijs, Robbert W. E, Sturm, Jacobus M, Zameshin, Andrey A, Bijkerk, Fred

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Nb Texture Evolution and Interdiffusion in Nb/Si-Layered Systems von Chandrasekaran, Anirudhan, van de Kruijs, Robbert W.E, Sturm, Jacobus M, Bijkerk, Fred

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Bifunctional catalytic effect of Mo2C/oxide interface on multi-layer graphene growth von Kizir, Seda, van den Beld, Wesley T. E., Schurink, Bart, van de Kruijs, Robbert W. E., Benschop, Jos P. H., Bijkerk, Fred

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Determination of optical constants of thin films in the EUV von Ciesielski, Richard, Saadeh, Qais, Philipsen, Vicky, Opsomer, Karl, Soulié, Jean-Philippe, Wu, Meiyi, Naujok, Philipp, van de Kruijs, Robbert W E, Detavernier, Christophe, Kolbe, Michael, Scholze, Frank, Soltwisch, Victor

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Chemical Interaction of Hydrogen Radicals (H) with Transition Metal Nitrides von Rehman, Abdul, van de Kruijs, Robbert W. E., van den Beld, Wesley T. E., Sturm, Jacobus M., Ackermann, Marcelo

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Chemically Stable Group IV–V Transition Metal Carbide Thin Films in Hydrogen Radical Environments von Rehman, Abdul, van de Kruijs, Robbert W.E., van den Beld, Wesley T.E., Sturm, Jacobus M., Ackermann, Marcelo

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Hydrogen etch resistance of aluminium oxide passivated graphitic layers von Kizir, Seda, van den Beld, Wesley T E, Verbakel, Jort D, Pushkarev, Roman, Houweling, Z Silvester, van de Kruijs, Robbert W E, Benschop, Jos P H, Bijkerk, Fred

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Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources von Sobierajski, Ryszard, Loch, Rolf Antonie, van de Kruijs, Robbert W. E., Louis, Eric, von Blanckenhagen, Gisela, Gullikson, Eric M., Siewert, Frank, Wawro, Andrzej, Bijkerk, Fred

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Microstructure of Mo/Si multilayers with B4C diffusion barrier layers von Nedelcu, Ileana, van de Kruijs, Robbert W E, Yakshin, Andrey E, Bijkerk, Fred

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Experimental study of EUV mirror radiation damage resistance under long‐term free‐electron laser exposures below the single‐shot damage threshold von Makhotkin, Igor A., Sobierajski, Ryszard, Chalupský, Jaromir, Tiedtke, Kai, de Vries, Gosse, Störmer, Michael, Scholze, Frank, Siewert, Frank, van de Kruijs, Robbert W. E., Milov, Igor, Louis, Eric, Jacyna, Iwanna, Jurek, Marek, Klinger, Dorota, Nittler, Laurent, Syryanyy, Yevgen, Juha, Libor, Hájková, Věra, Vozda, Vojtěch, Burian, Tomáš, Saksl, Karel, Faatz, Bart, Keitel, Barbara, Plönjes, Elke, Schreiber, Siegfried, Toleikis, Sven, Loch, Rolf, Hermann, Martin, Strobel, Sebastian, Nienhuys, Han-Kwang, Gwalt, Grzegorz, Mey, Tobias, Enkisch, Hartmut

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Sputtering and nitridation of transition metal surfaces under low energy, steady state nitrogen ion bombardment von Phadke, Parikshit, Sturm, Jacobus M., van de Kruijs, Robbert W.E., Bijkerk, Fred

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Fracture Toughness of Free-Standing ZrSix Thin Films Measured Using Crack-on-a-Chip Method von Shafikov, Airat, van de Kruijs, Robbert, Benschop, Jos, van den Beld, Wesley, Houweling, Silvester, Bijkerk, Fred

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Work-Function-Dependent Reduction of Transition Metal Nitrides in Hydrogen Environments von Rehman, Abdul, van de Kruijs, Robbert W. E., van den Beld, Wesley T. E., Sturm, Jacobus M., Ackermann, Marcelo

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Synthesis and Characterization of Boron Thin Films Using Chemical and Physical Vapor Depositions von Schurink, Bart, van den Beld, Wesley T. E., Tiggelaar, Roald M., van de Kruijs, Robbert W. E., Bijkerk, Fred

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Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model von Phadke, Parikshit, Zameshin, Andrey A., Sturm, Jacobus M., van de Kruijs, Robbert W.E., Bijkerk, Fred

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Structural properties of subnanometer thick Y layers in extreme ultraviolet multilayer mirrors von Bosgra, Jeroen, Zoethout, Erwin, van der Eerden, Ad M J, Verhoeven, Jan, van de Kruijs, Robbert W E, Yakshin, Andrey E, Bijkerk, Fred

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Near-threshold, steady state interaction of oxygen ions with transition metals: Sputtering and radiation enhanced diffusion von Phadke, Parikshit, Stilhano Vilas Boas, Cristiane R., Sturm, Jacobus M., van de Kruijs, Robbert W.E., Bijkerk, Fred

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Near-threshold sputter yields of ruthenium under argon and nitrogen ion bombardment von Phadke, Parikshit, Sturm, Jacobus M., van de Kruijs, Robbert W.E., Bijkerk, Fred

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Reconstruction of interfaces of periodic multilayers from X-ray reflectivity using a free-form approach von Zameshin, Andrey, Makhotkin, Igor A., Yakunin, Sergey N., van de Kruijs, Robbert W. E., Yakshin, Andrey E., Bijkerk, Fred

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Structural pathways for ultrafast melting of optically excited thin polycrystalline Palladium films von Antonowicz, Jerzy, Olczak, Adam, Sokolowski-Tinten, Klaus, Zalden, Peter, Milov, Igor, Dzięgielewski, Przemysław, Bressler, Christian, Chapman, Henry N., Chojnacki, Michał, Dłużewski, Piotr, Rodriguez-Fernandez, Angel, Fronc, Krzysztof, Gawełda, Wojciech, Georgarakis, Konstantinos, Greer, Alan L., Jacyna, Iwanna, van de Kruijs, Robbert W.E., Kamiński, Radosław, Khakhulin, Dmitry, Klinger, Dorota, Kosyl, Katarzyna M., Kubicek, Katharina, Migdal, Kirill P., Minikayev, Roman, Panagiotopoulos, Nikolaos T., Sikora, Marcin, Sun, Peihao, Yousef, Hazem, Zajkowska-Pietrzak, Wiktoria, Zhakhovsky, Vasily V., Sobierajski, Ryszard

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