A first-principles model for estimating the prevalence of annoyance with aircraft noise exposure von Fidell, Sanford, Mestre, Vincent, Schomer, Paul, Berry, Bernard, Gjestland, Truls, Vallet, Michel, Reid, Timothy

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Role of community tolerance level (CTL) in predicting the prevalence of the annoyance of road and rail noise von Schomer, Paul, Mestre, Vincent, Fidell, Sanford, Berry, Bernard, Gjestland, Truls, Vallet, Michel, Reid, Timothy

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Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation von PARRASSIN, Thierry, CELI, Guillaume, DUDIT, Sylvain, VALLET, Michel

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Failure analysis defect location on a real case 55nm memory using dynamic power supply emulation von Parrassin, Thierry, Celi, Guillaume, Dudit, Sylvain, Vallet, Michel

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LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis von Celi, Guillaume, Dudit, Sylvain, Parrassin, Thierry, Perdu, Philippe, Reverdy, Antoine, Lewis, Dean, Vallet, Michel

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Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below) von Celi, Guillaume, Dudit, Sylvain, Perdu, Philippe, Reverdy, Antoine, Parrassin, Thierry, Bechet, Emmanuel, Lewis, Dean, Vallet, Michel

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Vigilance et transports: Aspects fondamentaux, dégradation et prévention

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Low-frequency noise around airports von Vallet, Michel, Bruyere, Jean Claude

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Dynamic Thermal Laser Stimulation Theory and Applications von Sanchez, K., Desplats, R., Beaudoin, F., Perdu, P., Dudit, S., Vallet, M., Lewis, D.

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Interview. La Casa musicale, à Perpignan von Vallet, Michel, Sanchez, Maïté

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Electrical testing for failure analysis: E-beam testing von Vallet, Michel, Sardin, Philippe

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Integrated circuit having at least one metallization level von Vallet, Michel

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Integrated circuit having at least one metallization level von VALLET MICHEL

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Integrated circuit having at least one metallization level von VALLET MICHEL

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Test pad having an automatic positioning microprobe and method for realisation therefor von VALLET, MICHEL

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Semiconductor circuit having surface features and method of adjusting a tool with respect to this surface von Vallet, Michel

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Semiconductor circuit having surface features and method of adjusting a tool with respect to this surface von VALLET MICHEL

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CIRCUIT SEMI-CONDUCTEUR COMPRENANT DES MOTIFS EN SURFACE ET PROCEDE DE REGLAGE D'UN OUTIL PAR RAPPORT A CETTE SURFACE von VALLET MICHEL

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Integrated circuit test pad von VALLET MICHEL

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Test area with automatic positioning of a microprobe and a method of producing such a test area von VALLET MICHEL

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