Symmetric physically unclonable functions of the arbiter type von Yarmolik, V. N., Ivaniuk, A. A.

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Synthesis of Test Sequences with a Given Switching Activity von Yarmolik, V. N., Shevchenko, N. A.

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Difference Measure for Controlled Random Tests von Yarmolik, V. N., Petrovskaya, V. V., Shauchenka, M. A.

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Dissimilarity measures based on the application of Hamming distance to generate controlled probabilistic tests von Yarmolik, V. N., Petrovskaya, V. V., Shevchenko, N. A.

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A measure of the difference between test sets for generating controlled random tests von Yarmolik, V. N., Petrovskaya, V. V., Mrozek, I.

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2D physically unclonable functions of the arbiter type von Yarmolik, V. N., Ivaniuk, A. A.

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Pseudoexhaustive memory testing based on March A type march tests von Yarmolik, V. N., Mrozek, I., Yarmolik, S. V.

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Dissimilarity Measure Properties of Binary Test Patterns of Controlled Random Tests von Yarmolik, V. N., Petrovskaya, V. V., Ivaniuk, A. A.

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Arbiter Physical Unclonable Functions with Asymmetric Pairs of Paths von Yarmolik, V. N., Ivaniuk, A. A.

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Formal description model and conditions for detecting linked coupling faults of the memory devices von Yarmolik, V. N., Demenkovets, D. V., Petrovskaya, V. V., Ivaniuk, A. A.

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Distance Measure for Controlled Random Tests von Yarmolik, V. N., Shauchenka, M. A., Petrovskaya, V. V.

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Physically unclonable functions with controlled propagation delay von Yarmolik, V. N., Ivaniuk, A. A., Shynkevich, N. N.

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Generation of address sequences with specified switching activity and address repeatability von Yarmolik, V. N., Shevchenko, N. A., Levantsevich, V. А., Demenkovets, D. V.

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Generation of address sequences with a given switching activity von Yarmolik, V. N., Shevchenko, N. A.

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Transparent memory tests with even repeating addresses for storage devices von Yarmolik, V. N., Mrozek, I. M., Levantsevich, V. A., Demenkovets, D. V.

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Transparent memory testing based on dual address sequences von Yarmolik, V. N., Mrozek, I., Levantsevich, V. A., Demenkovets, D. V.

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Construction and application of march tests for pattern sensitive memory faults detection von Yarmolik, V. N., Levantsevich, V. A., Demenkovets, D. V., Mrozek, I.

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Universal Address Sequence Generator for Memory Built-in Self-test von Mrozek, I, Shevchenko, N A, Yarmolik, V N

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Analysis and Synthesis March Memory Tests von V. N. Yarmolik, V. A. Levantsevich, D. V. Demenkovets

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Analysis and Synthesis March Memory Tests von V. N. Yarmolik, V. A. Levantsevich, D. V. Demenkovets

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