Domino logic designs for high-performance and leakage-tolerant applications von Moradi, Farshad, Vu Cao, Tuan, Vatajelu, Elena I., Peiravi, Ali, Mahmoodi, Hamid, Wisland, Dag T.

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Sram cell stability metric under transient voltage noise von Vătăjelu, Elena I., Gómez-Pau, Álvaro, Renovell, Michel, Figueras, Joan

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Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric von Vatajelu, E. I., Gómez-Pau, A., Renovell, M., Figueras, J.

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Statistical analysis of 6T SRAM data retention voltage under process variation von Vatajelu, Elena I., Figueras, Joan

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Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation von Vatajelu, Elena I., Figueras, Joan

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Parametric failure analysis of embedded SRAMs using fast & accurate dynamic analysis von Vatajelu, Elena I, Panagopoulos, Georgios, Roy, Kaushik, Figueras, Joan

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Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation von Vatajelu, E. I., Figueras, J.

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Reliability estimation at block-level granularity of spin-transfer-torque MRAMs von Di Carlo, Stefano, Indaco, Marco, Prinetto, Paolo, Vatajelu, Elena Ioana, Rodríguez Montañés, Rosa, Figueras Pàmies, Joan

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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell von Vatajelu, Elena I., Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Wrobel, F., Salgne, F.

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STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations von Vatajelu, Elena Ioana, Rodríguez Montañés, Rosa, Indaco, Marco, Prinetto, Paolo, Figueras Pàmies, Joan

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Power-aware voltage tuning for STT-MRAM reliability von Vatajelu, Elena Ioana, Rodríguez Montañés, Rosa, Di Carlo, Stefano, Renovell, Michel, Prinetto, Paolo, Figueras Pàmies, Joan

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Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures von Vatajelu, E. I., Bosio, A., Dilillo, L., Girard, P., Todri, A., Virazel, A., Badereddine, N.

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SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations von Tsiligiannis, G., Vatajelu, Elena I., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Wrobel, F., Saigne, F.

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Analyzing resistive-open defects in SRAM core-cell under the effect of process variability von Vatajelu, Elena I., Bosio, A., Dilillo, L., Girard, P., Todri, A., Virazel, A., Badereddine, N.

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Bi-sigmoid spike-timing dependent plasticity learning rule for magnetic tunnel junction-based SNN von Daddinounou, Salah, Vatajelu, Elena-Ioana

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SRAM-Based PUF Readouts von Vinagrero, Sergio, Martin, Honorio, de Bignicourt, Alice, Vatajelu, Elena-Ioana, Di Natale, Giorgio

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Python Framework for Modular and Parametric SPICE Netlists Generation von Vinagrero Gutiérrez, Sergio, Di Natale, Giorgio, Vatajelu, Elena-Ioana

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Guest Editorial: Computation-In-Memory (CIM): from Device to Applications von Hamdioui, Said, Vatajelu, Elena-Ioana, Bosio, Alberto

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Analog memristive devices based on La2NiO4+ δ as synapses for spiking neural networks von Khuu, Thoai-Khanh, Koroleva, Aleksandra, Degreze, Arnaud, Vatajelu, Elena-Ioana, Lefèvre, Gauthier, Jiménez, Carmen, Blonkowski, Serge, Jalaguier, Eric, Bsiesy, Ahmad, Burriel, Mónica

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High-Entropy STT-MTJ-Based TRNG von Vatajelu, Elena Ioana, Di Natale, Giorgio

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