Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils von Hönicke, P., Kolbe, M., Krumrey, M., Unterumsberger, R., Beckhoff, B.

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Experimental determination of the x-ray atomic fundamental parameters of nickel von Ménesguen, Y, Lépy, M-C, Hönicke, P, Müller, M, Unterumsberger, R, Beckhoff, B, Hoszowska, J, Dousse, J-Cl, B achucki, W, Ito, Y, Yamashita, M, Fukushima, S

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A compact and versatile grating spectrograph for soft X-ray emission analysis von Mantouvalou, I., Staeck, S., Jonas, A., Grötzsch, D., Spanier, M., Baumann, J., Witte, K., Unterumsberger, R., Müller, M., Kanngießer, B.

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High accuracy experimental determination of copper and zinc mass attenuation coefficients in the 100 eV to 30 keV photon energy range von Ménesguen, Y, Gerlach, M, Pollakowski, B, Unterumsberger, R, Haschke, M, Beckhoff, B, Lépy, M-C

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Enhancing the efficiency of a wavelength-dispersive spectrometer based on a slitless design using a single-bounce monocapillary von Bzheumikhova, Karina, Kayser, Y, Unterumsberger, R, Weser, J, Stadelhoff, C, Beckhoff, B

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Experimental determination of the oxygen K-shell fluorescence yield using thin SiO 2 and Al 2 O 3 foils von Hönicke, P., Kolbe, M., Krumrey, M., Unterumsberger, R., Beckhoff, B.

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Theoretical and experimental determination of L -shell decay rates, line widths, and fluorescence yields in Ge von Guerra, M., Sampaio, J. M., Madeira, T. I., Parente, F., Indelicato, P., Marques, J. P., Santos, J. P., Hoszowska, J., Dousse, J.-Cl, Loperetti, L., Zeeshan, F., Müller, M., Unterumsberger, R., Beckhoff, B.

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Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films von Streeck, C., Brunken, S., Gerlach, M., Herzog, C., Hönicke, P., Kaufmann, C. A., Lubeck, J., Pollakowski, B., Unterumsberger, R., Weber, A., Beckhoff, B., Kanngießer, B., Schock, H.-W., Mainz, R.

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Focusing of soft X-ray radiation and characterization of the beam profile enabling X-ray emission spectrometry at nanolayered specimens von Unterumsberger, R., Müller, M., Beckhoff, B., Hönicke, P., Pollakowski, B., Bjeoumikhova, S.

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Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se{sub 2} absorber films von Streeck, C., Physikalisch-Technische Bundesanstalt, Abbestr.2-12, 10587 Berlin, Brunken, S., Kaufmann, C. A., Weber, A., Schock, H.-W., Mainz, R., Gerlach, M., Hönicke, P., Lubeck, J., Pollakowski, B., Unterumsberger, R., Beckhoff, B., Herzog, C., Kanngießer, B.

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