Poly-dimethyl-siloxane (PDMS) contamination of polystyrene (PS) oligomers samples: a comparison of time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photo... von Oran, U, Ünveren, E, Wirth, T, Unger, W.E.S

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Study of influence of external plasma parameters on plasma polymerised films prepared from organic molecules (acrylic acid, allyl alcohol, allyl amine) using XPS and NEXAFS von Swaraj, S., Oran, U., Lippitz, A., Friedrich, J.F., Unger, W.E.S.

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Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination? von Dietrich, P. M., Streeck, C., Glamsch, S., Ehlert, C., Lippitz, A., Nutsch, A., Kulak, N., Beckhoff, B., Unger, W. E. S.

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Stress corrosion cracking of gas-tungsten arc welds in continuous-cast AZ31Mg alloy sheet von Winzer, N., Xu, P., Bender, S., Gross, T., Unger, W.E.S., Cross, C.E.

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Click chemistry on silicon nitride for biosensor fabrication von Dietrich, P.M., Lange, N., Lippitz, A., Holzweber, M., Kulak, N., Unger, W.E.S.

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Determining shell thicknesses in stabilised CdSe@ZnS core-shell nanoparticles by quantitative XPS analysis using an Infinitesimal Columns model von Kalbe, H., Rades, S., Unger, W.E.S.

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Surface chemical characterization of model glycan surfaces and shelf life studies of glycan microarrays using XPS, NEXAFS spectroscopy, ToF-SIMS and fluorescence scanning von Nietzold, C., Dietrich, P.M., Holzweber, M., Lippitz, A., Kamalakumar, A., Blanchard, V., Ivanov-Pankov, S., Weigel, W., Panne, U., Unger, W.E.S.

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Shell thickness determination for PTFE‐PS core‐shell nanoparticles using scanning transmission X‐ray microscopy (STXM) von Müller, A., Swaraj, S., Sparnacci, K., Unger, W.E.S.

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Static ToF-SIMS analysis of plasma chemically deposited ethylene/allyl alcohol co-polymer films von Oran, U., Swaraj, S., Friedrich, J.F., Unger, W.E.S.

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Summary of ISO/TC 201 Technical Report: ISO/TR 19693 Surface chemical analysis—Characterization of functional glass substrates for biosensing applications von Dietrich, P. M., Unger, W. E. S.

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Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards von Senoner, M., Maaßdorf, A., Rooch, H., Österle, W., Malcher, M., Schmidt, M., Kollmer, F., Paul, D., Hodoroaba, V.-D., Rades, S., Unger, W. E. S.

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Oxygen plasma induced degradation of the surface of poly(styrene), poly(bisphenol-A-carbonate) and poly(ethylene terephthalate) as observed by soft X-ray absorption spectroscopy (N... von Koprinarov, I., Lippitz, A., Friedrich, J.F., Unger, W.E.S., Wöll, Ch

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Spectroscopic characterization of crystalline AlF3 phases von König, R., Scholz, G., Scheurell, K., Heidemann, D., Buchem, I., Unger, W.E.S., Kemnitz, E.

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Comprehensive characterization of ball-milled powders simulating a tribofilm system von Häusler, I., Dörfel, I., Peplinski, B., Dietrich, P.M., Unger, W.E.S., Österle, W.

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Stress corrosion cracking of gas-tungsten arc welds in continuous-cast AZ31 Mg alloy sheet von Winzer, N., Xu, P., Bender, S., Gross, T., Unger, W.E.S., Cross, C.E.

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Surface analysis of partially crystalline and amorphous poly(ethylene terephthalate) samples by X-ray absorption spectroscopy (NEXAFS) von Lippitz, A., Friedrich, J.F., Unger, W.E.S., Schertel, A., Wöll, Ch

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Surface analysis of DC oxygen plasma treated or chromium evaporated poly(ethylene terephthalate) foils by soft X-ray absorption spectroscopy (NEXAFS) von Koprinarov, I., Lippitz, A., Friedrich, J.F., Unger, W.E.S., Wöll, Ch

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Chemical analysis of plasma-polymerized films: The application of X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (NEXAFS) and fourier transform infrared spec... von Retzko, I., Friedrich, J.F., Lippitz, A., Unger, W.E.S.

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Some remarks on fitting standard- and high resolution C 1s and O 1s x-ray photoelectron spectra of PMMA von Gross, Th, Lippitz, A., Unger, W.E.S., Wöll, Ch, Hähner, G., Braun, W.

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Spectroscopic characterization of crystalline AlF 3 phases von König, R., Scholz, G., Scheurell, K., Heidemann, D., Buchem, I., Unger, W.E.S., Kemnitz, E.

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