Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards von Senoner, M., Maaßdorf, A., Rooch, H., Österle, W., Malcher, M., Schmidt, M., Kollmer, F., Paul, D., Hodoroaba, V.-D., Rades, S., Unger, W. E. S.

Volltext

Erratum to: Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards von Senoner, M., Maaßdorf, A., Rooch, H., Österle, W., Malcher, M., Schmidt, M., Kollmer, F., Paul, D., Hodoroaba, V.-D., Rades, S., Unger, W. E. S.

Volltext

Quantification of Silane Molecules on Oxidized Silicon: Are there Options for a Traceable and Absolute Determination? von Dietrich, P. M., Streeck, C., Glamsch, S., Ehlert, C., Lippitz, A., Nutsch, A., Kulak, N., Beckhoff, B., Unger, W. E. S.

Volltext

Real Time Imaging of Deuterium in a Duplex Stainless Steel Microstructure by Time-of-Flight SIMS von Sobol, O., Straub, F., Wirth, Th, Holzlechner, G., Boellinghaus, Th, Unger, W. E. S.

Volltext

Ultra-thin SiO2 on Si IX: absolute measurements of the amount of silicon oxide as a thickness of SiO2 on Si von Seah, M. P., Unger, W. E. S., Wang, Hai, Jordaan, W., Gross, Th, Dura, J. A., Moon, Dae Won, Totarong, P., Krumrey, M., Hauert, R., Zhiqiang, Mo

Volltext

Thickness measurement of nm HfO2 films von Kim, K J, Kim, A, Kim, C S, Song, S W, Ruh, H, Unger, W E S, Radnik, J, Mata-Salazar, J, Juarez-Garcia, J M, Cortazar-Martinez, O, Herrera-Gomez, A, Hansen, P E, Madesen, J S, Senna, C A, Archanjo, B S, Damasceno, J C, Achete, C A, Wang, H, Wang, M, Windover, D, Steel, E, Kurokawa, A, Fujimoto, T, Azuma, Y, Terauchi, S, Zhang, L, Jordaan, W A, Spencer, S J, Shard, A G, Koenders, L, Krumrey, M, Busch, I, Jeynes, C

Volltext

Dual beam organic depth profiling using large argon cluster ion beams von Holzweber, M., Shard, A. G., Jungnickel, H., Luch, A., Unger, W. E. S.

Volltext

Derivatization of amino groups by pentafluorobenzaldehyde (PFB) as observed by XPS and NEXAFS spectroscopy on spin coated 4,4′-methylenebis(2,6-diethylaniline) films von Yegen, E., Lippitz, A., Treu, D., Unger, W. E. S.

Volltext

Lateral resolution of secondary ion mass spectrometry-results of an inter-laboratory comparison von Senoner, M., Unger, W. E. S.

Volltext

Lateral Resolution of Imaging Surface-Analytical Instruments as SIMS, AES and XPS: Application of the BAM-L200 Certified Reference Material and Related ISO Standards von Unger, W. E. S., Senoner, M., Wirth, Th, Bütefisch, S., Busch, I.

Volltext

Summary of ISO/TC 201 Technical Report: ISO/TR 19693 Surface chemical analysis—Characterization of functional glass substrates for biosensing applications von Dietrich, P. M., Unger, W. E. S.

Volltext

Summary of ISO/TC 201 Technical Report: ISO/TR 19319:2013 - Surface chemical analysis - Fundamental approaches to determination of lateral resolution and sharpness in beam-based me... von Senoner, M., Unger, W. E. S.

Volltext

A comparison of laparoscopic and open treatment of acute cholecystitis von UNGER, S. W, ROSENBAUM, G, UNGER, H. M, EDELMAN, D. S

Volltext

New azidation methods for the functionalization of silicon nitride and application in copper-catalyzed azide-alkyne cycloaddition (CuAAC) von Lange, N., Dietrich, P. M., Lippitz, A., Kulak, N., Unger, W. E. S.

Volltext

Neutral hydrogen studies of the Seyfert galaxy NGC 3227 von Mundell, C. G., Pedlar, A., Axon, D. J., Meaburn, J., Unger, S. W.

Volltext

Simultaneous surface and bulk sensitive XAS measurements of magnetic particle clusters von Swaraj, S, Dietrich, P M, Unger, W E S

Volltext

Cyclodextrin - ferrocene host - guest complexes on silicon oxide surfaces von Nietzold, C., Dietrich, P. M., Lippitz, A., Panne, U., Unger, W. E. S.

Volltext

Microlaparoscopic cholecystectomy. Less invasive gallbladder surgery von Unger, S W, Paramo, J C, Perez, M

Volltext

Static ToF-SIMS analysis of plasma chemically deposited ethylene/allyl alcohol co-polymer films von Oran, U., Swaraj, S., Friedrich, J.F., Unger, W.E.S.

Volltext

Radio frequency (r.f.) plasma-deposited polymer films: influence of external plasma parameters as viewed by comprehensive in-situ surface chemical analysis by XAS, XPS and ToF-SIMS von Unger, W. E. S., Swaraj, S., Oran, U., Lippitz, A.

Volltext