Analysis of interface states in Au/ZnO/p-InP (MOS) structure von Acar, F. Z., Buyukbas-Ulusan, A., Tataroglu, A.

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A Compare Study on Electrical Properties of MS Diodes with and Without CoFe2O4-PVP Interlayer von Tataroglu, A., Buyukbas Ulusan, A., Altındal, Ş., Azizian-Kalandaragh, Y.

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Analysis of barrier inhomogeneities in AuGe/n-Ge Schottky diode von Buyukbas Ulusan, A, Tataroglu, A

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A comparative study on the electrical and dielectric properties of Al/Cd-doped ZnO/p-Si structures von Buyukbas-Ulusan, A., Taşçıoğlu, İ., Tataroğlu, A., Yakuphanoğlu, F., Altındal, S.

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Electrical characterization of silicon nitride interlayer-based MIS diode von Buyukbas-Ulusan, A., Tataroglu, A.

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Photoresponse characteristics of Au/(CoFe2O4-PVP)/n-Si/Au (MPS) diode von Ulusan, A. Buyukbas, Tataroglu, A., Altındal, Ş., Azizian-Kalandaragh, Y.

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On the conduction mechanisms of Au/(Cu2O–CuO–PVA)/n-Si (MPS) Schottky barrier diodes (SBDs) using current–voltage–temperature (I–V–T) characteristics von Büyükbaş Uluşan, A., Tataroğlu, A., Azizian-Kalandaragh, Y., Altındal, Ş.

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Ionizing radiation effects on Au/TiO2/n-Si metal–insulator-semiconductor (MIS) structure von Ertugrul-Uyar, R., Buyukbas-Ulusan, A., Tataroglu, A.

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Forward and reverse bias current–voltage (I–V) characteristics in the metal–ferroelectric–semiconductor (Au/SrTiO3/n-Si) structures at room temperature von Buyukbas-Ulusan, A., Altındal-Yerişkin, S., Tataroğlu, A.

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Electrical and impedance properties of MPS structure based on (Cu2O–CuO–PVA) interfacial layer von Buyukbas-Uluşan, A., Yerişkin, S. Altındal, Tataroğlu, A., Balbaşı, M., Kalandaragh, Y. Azizian

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Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure von Uluşan, A. Büyükbaş, Tataroğlu, A.

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Impedance spectroscopy of Au/TiO2/n-Si metal-insulator-semiconductor (MIS) capacitor von Büyükbaş-Uluşan, A., Tataroğlu, A.

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Double-exponential current–voltage (I–V) and negative capacitance (NC) behavior of Al/(CdSe-PVA)/p-Si/Al (MPS) structure von Büyükbaş-Uluşan, A., Tataroğlu, A., Azizian-Kalandaragh, Y., Koşal, M.

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Analysis of the Current Transport Characteristics (CTCs) in the Au/n-Si Schottky Diodes (SDs) with Al 2 O 3 Interfacial Layer over Wide Temperature Range von Buyukbas-Ulusan, A., Tataroglu, A., Altındal-Yerişkin, S.

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Analysis of the Current Transport Characteristics (CTCs) in the Au/n-Si Schottky Diodes (SDs) with Al2O3 Interfacial Layer over Wide Temperature Range von Buyukbas-Ulusan, A., Tataroglu, A., Altındal-Yerişkin, S.

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