Cryogenic UHV Specimen Preparation for APT: A Transfer Solution von Rice, KP, Ulfig, RM, Maier, U, Passey, RG

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Correlative Analysis in the Semiconductor Industry von Larson, DJ, Prosa, TJ, Martin, I, Robbes, A-S, Merkulov, A, Bernier, N, Delaye, V, van der Heide, P, Dulac, O, Reinhard, DA, Ulfig, RM

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Intermixing and phase separation at the atomic scale in Co-rich (Co,Fe) and Cu multilayered nanostructures von Ladwig, Peter F., Olson, Jesse D., Bunton, Joseph H., Larson, David J., Ulfig, Robert M., Martens, Richard L., Gribb, Tye T., Kelly, Thomas F., Bonsager, Martin C., Schultz, Allan E., Pant, Bharat B., Chang, Y. Austin

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Field ion specimen preparation from near-surface regions von Larson, D.J, Miller, M.K, Ulfig, R.M, Matyi, R.J, Camus, P.P, Kelly, T.F

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