Compact high-aperture interferometer with a diffractive reference wave for high-precision referenceless aberration measurements of optical elements and systems von Akhsakhalyan, A.A., Chkhalo, N.I., Kumar, N., Malyshev, I.V., Pestov, A.E., Salashchenko, N.N., Toropov, M.N., Ulasevich, B.A., Kuzin, S.V.

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Measurements of the absolute intensities of spectral lines of Kr, Ar, and O ions in the wavelength range of 10 – 18 nm under pulsed laser excitation von Vodop’yanov, A.V., Garakhin, S.A., Zabrodin, I.G., Zuev, S.Yu, Lopatin, A.Ya, Nechay, A.N., Pestov, A.E., Perekalov, A.A., Pleshkov, R.S., Polkovnikov, V.N., Salashchenko, N.N., Smertin, R.M., Ulasevich, B.A., Chkhalo, N.I.

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