Ion beam polishing for three‐dimensional electron backscattered diffraction von SAOWADEE, N., AGERSTED, K., UBHI, H.S., BOWEN, J.R.

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Biological control of crystallographic architecture: Hierarchy and co-alignment parameters von Maier, B.J., Griesshaber, E., Alexa, P., Ziegler, A., Ubhi, H.S., Schmahl, W.W.

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Brazed joints in γ TiAl sheet: microstructure and properties von Wallis, I.C., Ubhi, H.S., Bacos, M.-P., Josso, P., Lindqvist, J., Lundstrom, D., Wisbey, A.

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The effect of high temperature exposure on the tensile properties of γ TiAl alloys von Pather, R, Mitten, W.A, Holdway, P, Ubhi, H.S, Wisbey, A, Brooks, J.W

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Measurement of fatigue crack plastic zones in fine grained materials using electron backscattered diffraction von Tucker, A.T., Wilkinson, A.J., Henderson, M.B., Ubhi, H.S., Martin, J.W.

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Tensile properties of helical diamond fibres with platinum wire core von Partridge, P.G., Humberstone, L., Doble, J.B., Gilmore, C.J., Ubhi, H.S.

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Diamond fibres by a hot filament CVD process von Griffith, P.W., Wisbey, A., Shatwell, R.A., Ubhi, H.S., Meaden, G.M., Loader, C.B.

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The influence of manganese and silicon on the precipitation of vanadium carbide in steel von Ubhi, H.S., Baker, T.N.

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Micro-Texture Analysis of Diffusion Bonded Interfaces in Al-Li Alloy Sheet von Ubhi, H.S., Bowen, A.W.

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Under-mask beard cover (Singh Thattha technique) for donning respirator masks in COVID-19 patient care von Singh, R., Safri, H.S., Singh, S., Ubhi, B.S., Singh, G., Alg, G.S., Randhawa, G., Gill, S.

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Total ionizing dose hardness analysis of transistors in commercial 180 nm CMOS technology von Kumar, Mukesh, Ubhi, Jagpal Singh, Basra, Sanjeev, Chawla, Anuj, Jatana, H.S.

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