Effects of air-annealing on the electrical properties of p-type tin monoxide thin-film transistors von Cho, In-Tak, U, Myeonghun, Song, Sang-Hun, Lee, Jong-Ho, Kwon, Hyuck-In

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Bias-Stress-Induced Instabilities in P-Type Cu2O Thin-Film Transistors von PARK, Ick-Joon, JEONG, Chan-Yong, MYEONGHUN, U, SONG, Sang-Hun, CHO, In-Tak, LEE, Jong-Ho, CHO, Eou-Sik, KWON, Hyuck-In

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Effects of the active layers deposition temperature on the electrical performance of p-type SnO thin-film Transistors von U, Myeonghun, Kwon, Hyuck-In, Cho, In-Tak, Jin, Sung Hun, Lee, Jong-Ho

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Displacement sensitivity comparison between the first two symmetrical in-plane modes of a tuning fork crystal oscillator by using an optical chopping method von Choi, Hyo-Seung, U, Myeonghun, Jeong, Chan-Yong, Kwon, Hyuck-In, Song, Sang-Hun

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High Performance p-type SnO thin-film Transistor with SiOx Gate Insulator Deposited by Low-Temperature PECVD Method von Myeonghun U, Young-Joon Han, Sang-Hun Song, In-Tak Cho, Jong-Ho Lee, Hyuck-In Kwon

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Bias-Stress-Induced Instabilities in P-Type Thin-Film Transistors von Park, Ick-Joon, Jeong, Chan-Yong, U, Myeonghun, Song, Sang-Hun, Cho, In-Tak, Lee, Jong-Ho, Cho, Eou-Sik, Kwon, Hyuck-In

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High Performance p-type SnO thin-film Transistor with SiO x Gate Insulator Deposited by Low-Temperature PECVD Method von U, Myeonghun, Han, Young-Joon, Song, Sang-Hun, Cho, In-Tak, Lee, Jong-Ho, Kwon, Hyuck-In

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High Performance p-type SnO thin-film Transistor with SiO x Gate Insulator Deposited by Low-Temperature PECVD Method von U, Myeonghun, Han, Young-Joon, Song, Sang-Hun, Cho, In-Tak, Lee, Jong-Ho, Kwon, Hyuck-In

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FINE METAL MASK von MYEONGHUN YU, JAEBEUM KIM, JIWOONG CHA, MINHYUNG CHOI

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Dark Matter Particle Spectroscopy at the LHC: Generalizing M(T2) to Asymmetric Event Topologies von Konar, Partha, /Florida U., Kong, Kyoungchul, /SLAC, Matchev, Konstantin T., Park, Myeonghun

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