Surface changes on LiNi0.8Co0.2O2 particles during testing of high-power lithium-ion cells von ABRAHAM, D. P, TWESTEN, R. D, BALASUBRAMANIAN, M, PETROV, I, MCBREEN, J, AMINE, K

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Microscopy and Spectroscopy of Lithium Nickel Oxide-Based Particles Used in High Power Lithium-Ion Cells von Abraham, D. P., Twesten, R. D., Balasubramanian, M., Kropf, J., Fischer, D., McBreen, J., Petrov, I., Amine, K.

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Observation of a magic discrete family of ultrabright Si nanoparticles von Belomoin, G., Therrien, J., Smith, A., Rao, S., Twesten, R., Chaieb, S., Nayfeh, M. H., Wagner, L., Mitas, L.

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Physical and mechanical properties of chromium zirconium nitride thin films von Aouadi, S.M., Maeruf, T., Twesten, R.D., Mihut, D.M., Rohde, S.L.

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High Speed EELS and EFTEM Analysis across the Visual Cortex von Longo, P., Twesten, R.D., Lin, W

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Structure determination of individual single-wall carbon nanotubes by nanoarea electron diffraction von Gao, M., Zuo, J. M., Twesten, R. D., Petrov, I., Nagahara, L. A., Zhang, R.

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A Simple, Model Based Approach for Robust Quantification of EELS Spectra and Spectrum-Images von Thomas, P.J., Twesten, R.D.

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Diagnosis of power fade mechanisms in high-power lithium-ion cells von Abraham, D.P, Liu, J, Chen, C.H, Hyung, Y.E, Stoll, M, Elsen, N, MacLaren, S, Twesten, R, Haasch, R, Sammann, E, Petrov, I, Amine, K, Henriksen, G

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Coherent nano-area electron diffraction von Zuo, J.M., Gao, M., Tao, J., Li, B.Q., Twesten, R., Petrov, I.

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Electron microscopy nanoscale characterization of ball milled Cu-Ag powders. Part II: Nanocomposites synthesized by elevated temperature milling or annealing von Zghal, S, Twesten, R, Wu, Fang, Bellon, P

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In situ Transmission Electron Microscopy Studies Enabled by Microelectromechanical System Technology von Zhang, M., Olson, E.A., Twesten, R.D., Wen, J.G., Allen, L.H., Robertson, I.M., Petrov, I.

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A Quantitative Investigation of Biological Materials using EELS von Longo, P., Twesten, R.D.

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High-Speed, Simultaneous EELS and EDS STEM-SI Acquisition von Twesten, R., Longo, P., Aitouchen, A., Thomas, P.J.

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Simultaneous High-Speed DualEELS and EDS Acquisition at Atomic Level von Longo, P., Topuria, T., Rice, P., Aitouchen, A, Thomas, P.J., Twesten, R.D.

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Fast Atomic Level EELS Mapping Analysis using High-Energy Edges in DualEELS Mode von Longo, P., Twesten, R.D., Thomas, P.J.

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Interface-induced nonswitchable domains in ferroelectric thin films von Han, Myung-Geun, Marshall, Matthew S.J., Wu, Lijun, Schofield, Marvin A., Aoki, Toshihiro, Twesten, Ray, Hoffman, Jason, Walker, Frederick J., Ahn, Charles H., Zhu, Yimei

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Physical Evidence that Yeast Frataxin Is an Iron Storage Protein von Gakh, Oleksandr, Adamec, Jiri, Gacy, A. Marquis, Twesten, Ray D, Owen, Whyte G, Isaya, Grazia

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Electron microscopy nanoscale characterization of ball-milled Cu–Ag powders. Part I: Solid solution synthesized by cryo-milling von Zghal, S., Hÿtch, M.J., Chevalier, J.-P., Twesten, R., Wu, F., Bellon, P.

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Real-time stress evolution during Si1-xGex Heteroepitaxy: Dislocations, islanding, and segregation von Floro, J. A., Chason, E., Lee, S. R., Twesten, R. D., Hwang, R. Q., Freund, L. B.

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Effect of process parameters on the structure of Si–Ti–N nanostructured coatings deposited by hypersonic plasma particle deposition von Hafiz, J., Mukherjee, R., Wang, X., Marshall, M., Twesten, R.D., Cullinan, M., Heberlein, J.V.R., McMurry, P.H., Girshick, S.L.

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