A Bag-of-Features Framework to Classify Time Series von Baydogan, M. G., Runger, G., Tuv, E.

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A time series forest for classification and feature extraction von Deng, Houtao, Runger, George, Tuv, Eugene, Vladimir, Martyanov

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CBC: An associative classifier with a small number of rules von Deng, Houtao, Runger, George, Tuv, Eugene, Bannister, Wade

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Bias of Importance Measures for Multi-valued Attributes and Solutions von Deng, Houtao, Runger, George, Tuv, Eugene

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Supervised learning for change-point detection von Li, Fang, Runger, George C., Tuv, Eugene

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Combining Unsupervised and Supervised Approaches to Feature Selection for Multivariate Signal Compression von Eruhimov, Victor, Martyanov, Vladimir, Raulefs, Peter, Tuv, Eugene

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Rule Induction for Identifying Multilayer Tool Commonalities von Borisov, A, Chikalov, I, St. Pierre, Eric, Tuv, E

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Scoring levels of categorical variables with heterogenous data von Tuv, Eugene, Runger, George C

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Best Subset Feature Selection for Massive Mixed-Type Problems von Tuv, Eugene, Borisov, Alexander, Torkkola, Kari

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Robust, Non-Redundant Feature Selection for Yield Analysis in Semiconductor Manufacturing von St. Pierre, Eric, Tuv, Eugene

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Supervised learning for change-point detection: Data mining and applications in engineering design, manufacturing and logistics von FANG LI, RUNGER, George C, TUV, Eugene

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Contributor Diagnostics for Anomaly Detection von Borisov, Alexander, Runger, George, Tuv, Eugene

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Zero-Inflated Boosted Ensembles for Rare Event Counts von Borisov, Alexander, Runger, George, Tuv, Eugene, Lurponglukana-Strand, Nuttha

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Public health surveillance with ensemble-based supervised learning von Dávila, Saylisse, Runger, George, Tuv, Eugene

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Multivariate statistical process control with artificial contrasts von Hwang, Wookyeon, Runger, George, Tuv, Eugene

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Rule induction for identifying multi layer tool commonalities von Borisov, Alexander, Chikalov, Igor, Pierre, Eric St, Tuv, Eugene

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Scoring levels of categorical variables with heterogeneous data von Tuv, E., Runger, G.C.

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Pre-processing of high-dimensional categorical predictors in classification settings von Tuv, Eugene, Runger, George

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Spatial Patterns in Sort Wafer Maps and Identifying Fab Tool Commonalities von Pierre, E.R.S., Tuv, E., Borisov, A.

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Semiconductor Yield Analysis and Multi-Chip Package (MCP) Die Pairing Optimization using Statistical-Learning von Goodwin, R., Miller, R., Tuv, E., Borisov, A.

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