Evaluation and Application of U.S. Medical Proton Facilities for Single Event Effects Test von Wie, Brian S., LaBel, Kenneth A., Turflinger, Thomas L., Wert, Jerry L., Foster, Charles C., Reed, Robert A., Kostic, Andrew D., Moss, Steven C., Guertin, Steven M., George, Jeffrey S., Pankuch, Mark, Dong, Lei, Bloch, Charles, Laub, Steve

Volltext

Single-event effects in analog and mixed-signal integrated circuits von Turflinger, T.L.

Volltext

Comparison of heavy ion and proton induced combinatorial and sequential logic error rates in a deep submicron process von Gadlage, M.J., Eaton, P.H., Benedetto, J.M., Turflinger, T.L.

Volltext

Digital Device Error Rate Trends in Advanced CMOS Technologies von Gadlage, M.J., Eaton, P.H., Benedetto, J.M., Carts, M., Vivian Zhu, Turflinger, T.L.

Volltext

A comprehensive analog single-event transient analysis methodology von Savage, M.W., Titus, J.L., Turflinger, T.L., Pease, R.L., Poivey, C.

Volltext

Protons, Aerospace, and Electronics: A National Interest von LaBel, Kenneth A., Turflinger, Thomas L.

Volltext bestellen

Protons, Aerospace, and Electronics: A National Interest von LaBel, Kenneth A., Turflinger, Thomas L.

Volltext bestellen

Protons, Aerospace, and Electronics: A National Interest von Label, Kenneth A., Turflinger, Thomas L.

Volltext bestellen

Understanding single event phenomena in complex analog and digital integrated circuits von Turflinger, T.L., Davey, M.V.

Volltext

Transient radiation test techniques for high-speed analog-to-digital converters von Turflinger, T.L., Davey, M.V.

Volltext

Radiation-Induced Response of Operational Amplifiers in Low-Level Transient Radiation Environments von Paulos, John J, Bishop, Richard J., Turflinger, Thomas L.

Volltext