Heterogeneous Integration of Atomically‐Thin Indium Tungsten Oxide Transistors for Low‐Power 3D Monolithic Complementary Inverter von Li, Zhen‐Hao, Chiang, Tsung‐Che, Kuo, Po‐Yi, Tu, Chun‐Hao, Kuo, Yue, Liu, Po‐Tsun

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Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress von Chen, Te-Chih, Chang, Ting-Chang, Tsai, Chih-Tsung, Hsieh, Tien-Yu, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun

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Modifying Indium-Tin-Oxide by Gas Cosputtering for Use as an Insulator in Resistive Random Access Memory von Po-Hsun Chen, Kuan-Chang Chang, Ting-Chang Chang, Tsung-Ming Tsai, Chih-Hung Pan, Yu-Ting Su, Cheng-Hsien Wu, Wan-Ching Su, Chih-Cheng Yang, Min-Chen Chen, Chun-Hao Tu, Kai-Huang Chen, Ikai Lo, Jin-Cheng Zheng, Sze, Simon M.

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Improved memory window for Ge nanocrystals embedded in SiON layer von Tu, Chun-Hao, Chang, Ting-Chang, Liu, Po-Tsun, Liu, Hsin-Chou, Sze, Simon M., Chang, Chun-Yen

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Formation of stacked Ni silicide nanocrystals for nonvolatile memory application von Chen, Wei-Ren, Chang, Ting-Chang, Liu, Po-Tsun, Lin, Po-Sun, Tu, Chun-Hao, Chang, Chun-Yen

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Paraffin wax passivation layer improvements in electrical characteristics of bottom gate amorphous indium–gallium–zinc oxide thin-film transistors von Chang, Geng-Wei, Chang, Ting-Chang, Syu, Yong-En, Tsai, Tsung-Ming, Chang, Kuan-Chang, Tu, Chun-Hao, Jian, Fu-Yen, Hung, Ya-Chi, Tai, Ya-Hsiang

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Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition von Chen, Te-Chih, Chang, Ting-Chang, Hsieh, Tien-Yu, Tsai, Chih-Tsung, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun

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Effects of channel width on electrical characteristics of polysilicon TFTs with multiple nanowire channels von WU, Yung-Chun, CHANG, Ting-Chang, LIU, Po-Tsun, CHEN, Chi-Shen, TU, Chun-Hao, ZAN, Hsiao-Wen, TAI, Ya-Hsiang, CHANG, Chun-Yen

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Charge storage characteristics of Mo nanocrystal dependence on Mo oxide reduction von Lin, Chao-Cheng, Chang, Ting-Chang, Tu, Chun-Hao, Chen, Wei-Ren, Hu, Chih-Wei, Sze, Simon M., Tseng, Tseung-Yuen, Chen, Sheng-Chi, Lin, Jian-Yang

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Cobalt nanodots formed by annealing the CoSiO layer for the application of the nonvolatile memory von Hu, Chih-Wei, Chang, Ting-Chang, Tu, Chun-Hao, Shueh, Pei-Kun, Lin, Chao-Cheng, Sze, Simon M., Tseng, Tseung-Yuen, Chen, Min-Chen

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Charge Storage Characteristics of Mo Nanocrystal Memory Influenced by Ammonia Plasma Treatment von Lin, Chao-Cheng, Chang, Ting-Chang, Tu, Chun-Hao, Chen, Wei-Ren, Hu, Chih-Wei, Sze, Simon M., Tseng, Tseung-Yuen, Chen, Sheng-Chi, Lin, Jian-Yang

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Nonvolatile memory characteristics of nickel-silicon-nitride nanocrystal von Chen, Wei-Ren, Chang, Ting-Chang, Liu, Po-Tsun, Yeh, Jui-Lung, Tu, Chun-Hao, Lou, Jen-Chung, Yeh, Ching-Fa, Chang, Chun-Yen

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Formation of cobalt-silicide nanocrystals in Ge-doped dielectric layer for the application on nonvolatile memory von Hu, Chih-Wei, Chang, Ting-Chang, Liu, Po-Tsun, Tu, Chun-Hao, Lee, Sheng-Kai, Sze, Simon M., Chang, Chun-Yen, Chiou, Bi-Shiou, Tseng, Tseung-Yuan

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P-15: Bias Stress Reliability for w/ and w/o Oxide-passivated IGZO TFTs von Tu, Chun-Hao, Lin, Wei-Ting, Chen, Chia-Hsiang, Hung, Ming-Chin, Chang, Jiun-Jye, Chiang, Ming-Feng, Liao, Wei-lung

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Improvements in the reliability of a-InGaZnO thin-film transistors with triple stacked gate insulator in flexible electronics applications von Chen, Hua-Mao, Chang, Ting-Chang, Tai, Ya-Hsiang, Chen, Kuan-Fu, Chiang, Hsiao-Cheng, Liu, Kuan-Hsien, Lee, Chao-Kuei, Lin, Wei-Ting, Cheng, Chun-Cheng, Tu, Chun-Hao, Liu, Chu-Yu

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Mobility enhancement of polycrystalline-Si thin-film transistors using nanowire channels by pattern-dependent metal-induced lateral crystallization von Wu, Yung-Chun, Chang, Ting-Chang, Liu, Po-Tsun, Wu, Yuan-Chun, Chou, Cheng-Wei, Tu, Chun-Hao, Lou, Jen-Chung, Chang, Chun-Yen

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Passivation Effect of Poly-Si Thin-Film Transistors With Fluorine-Ion-Implanted Spacers von Wei-Ren Chen, Ting-Chang Chang, Po-Tsun Liu, Chen Jung Wu, Chun-Hao Tu, Sze, S.M., Chun-Yen Chang

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Improved Performance of F-Ions-Implanted Poly-Si Thin-Film Transistors Using Solid Phase Crystallization and Excimer Laser Crystallization von Chun-Hao Tu, Ting-Chang Chang, Po-Tsun Liu, Che-Yu Yang, Li-Wei Feng, Chia-Chou Tsai, Li-Ting Chang, Yung-Chun Wu, Sze, S.M., Chun-Yen Chang

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Formation of stacked nickel-silicide nanocrystals by using a co-mixed target for nonvolatile memory application von Chen, Wei-Ren, Chang, Ting-Chang, Liu, Po-Tsun, Tu, Chun-Hao, Chi, Feng-Weng, Tsao, Shu-Wei, Chang, Chun-Yen

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50‐4: Novel Large‐size Process for Organic Thin‐Film Transistor Fabrication von Tsai, Chia-Hung, Liu, Kuan-Hsien, Wu, An-Ju, Hsu, Shih-Hua, Chen, Wei-Han, Tu, Chun-Hao, Liu, Chu-Yu, Chiang, Ming-Feng, Lin, Yu-Chieh

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