Noise Properties of Ag Nanoparticle-Decorated ZnO Nanorod UV Photodetectors von Yang, Chih-Chiang, Yu, Hsin-Chieh, Su, Yan-Kuin, Chuang, Ming-Yueh, Hsiao, Chih-Hung, Kao, Tsung-Hsien

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The Effect of Ga Doping Concentration on the Low-Frequency Noise Characteristics and Photoresponse Properties of ZnO Nanorods-Based UV Photodetectors von Yang, Chih-Chiang, Su, Yan-Kuin, Chuang, Ming-Yueh, Kao, Tsung-Hsien, Yu, Hsin-Chieh, Hsiao, Chih-Hung

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Low-Frequency Noise Characteristics of In-Doped ZnO Ultraviolet Photodetectors von Chang, Shoou-Jinn, Duan, Bi-Gui, Hsiao, Chih-Hung, Young, Sheng-Joue, Wang, Bo-Chin, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Wu, San-Lein

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Noise Properties of Low-Temperature-Grown Co-Doped ZnO Nanorods as Ultraviolet Photodetectors von Liu, Chung-Wei, Chang, Shoou-Jinn, Hsiao, Chih-Hung, Lo, Kuang-Yao, Kao, Tsung-Hsien, Wang, Bo-Chin, Young, Sheng-Joue, Tsai, Kai-Shiang, Wu, San-Lein

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ZnO-Based Ultraviolet Photodetectors With Novel Nanosheet Structures von Young, Sheng-Joue, Liu, Yi-Hsing, Hsiao, Chih-Hung, Chang, Shoou-Jinn, Wang, Bo-Chin, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Wu, San-Lein

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Noise Properties of Fe-ZnO Nanorod Ultraviolet Photodetectors von Chang, Shoou-Jinn, Liu, Chung-Wei, Hsiao, Chih-Hung, Lo, Kuang-Yao, Young, Sheng-Joue, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Wu, San-Lein

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Novel Ga-ZnO Nanosheet Structures Applied in Ultraviolet Photodetectors von Yang, Chih-Chiang, Su, Yan-Kuin, Hsiao, Chih-Hung, Young, Sheng-Joue, Kao, Tsung-Hsien, Chuang, Ming-Yueh, Huang, Yu-Chun, Wang, Bo-Chin, Wu, San-Lein

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Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis von Kao, Tsung-Hsien, Chang, Shoou-Jinn, Fang, Yean-Kuen, Huang, Po-Chin, Lai, Chien-Ming, Hsu, Chia-Wei, Chen, Yi-Wen, Cheng, Osbert, Wu, Chung-Yi, Wu, San-Lein

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Low-Frequency Noise Spectra of Laterally Bridged ZnO Microrod-Based Photodetectors von Chuang, Ming-Yueh, Yu, Hsin-Chieh, Su, Yan-Kuin, Hsiao, Chih-Hung, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Huang, Chien-Sheng, Huang, Yu-Chun, Wu, San-Lein

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Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain von Lo, Kun-Yuan, Cheng, Osbert, Fang, Yean-Kuen, Yang, Chih-Wei, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Huang, Po Chin, Wang, Bo-Chin, Chen, Jone-Fang, Wu, San-Lein, Tsai, Shih-Chang, Chen, Cheng-Guo

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Density-controlled and seedless growth of laterally bridged ZnO nanorod for UV photodetector applications von Chuang, Ming-Yueh, Yu, Hsin-Chieh, Su, Yan-Kuin, Hsiao, Chih-Hung, Kao, Tsung-Hsien, Huang, Chien-Sheng, Huang, Yu-Chun, Tsai, Jeng-Je, Wu, San-Lein

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Impact of Uniaxial Strain on Random Telegraph Noise in High- k /Metal Gate pMOSFETs von Po-Chin Huang, Chen, Jone F., Tsai, Shih Chang, San Lein Wu, Kai-Shiang Tsai, Tsung Hsien Kao, Yean-Kuen Fang, Chien-Ming Lai, Chia-Wei Hsu, Yi-Wen Chen, Cheng, Osbert

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Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation von Kao, Tsung-Hsien, Chang, Shoou-Jinn, Fang, Yean-Kuen, Huang, Po-Chin, Wang, Bo-Chin, Wu, Chung-Yi, Wu, San-Lein

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Low-frequency noise properties of metal-organic-metal ultraviolet sensors von Su, Peng-Yin, Chuang, Ricky-Wenkuei, Chen, Chin-Hsiang, Kao, Tsung-Hsien

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Characterization of High Mg Content MgZnO Ultraviolet Photodetectors with Noise Properties von Li, Jyun-Yi, Chang, Sheng-Po, Hsu, Ming-Hung, Kao, Tsung-Hsien, Chang, Shoou-Jinn

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Trap properties of high-k/metal gate pMOSFETs with aluminum ion implantation by random telegraph noise and 1/f noise measurements von Kao, Tsung-Hsien, Wu, San-Lein, Tsai, Kai-Shiang, Fang, Yean-Kuen, Lai, Chien-Ming, Hsu, Chia-Wei, Chen, Yi-Wen, Cheng, Osbert, Chang, Shoou-Jinn

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Interfacially polymerized thin-film composite polyamide membrane: positron annihilation spectroscopic study, characterization and pervaporation performance von Kao, Se-Tsung, Huang, Shu-Hsien, Liaw, Der-Jang, Chao, Wei-Chi, Hu, Chien-Chieh, Li, Chi-Lan, Wang, Da-Ming, Lee, Kueir-Rarn, Lai, Juin-Yih

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Impact of Aluminum Ion Implantation on the Low Frequency Noise Characteristics of Hf-Based High- \(k\) /Metal Gate pMOSFETs von Kao, Tsung-Hsien, Cheng, Osbert, Chang, Shoou-Jinn, Wu, San-Lein, Wu, Chung-Yi, Fang, Yean-Kuen, Wang, Bo-Chin, Huang, Po Chin, Lai, Chien-Ming, Hsu, Chia-Wei, Chen, Yi-Wen

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Investigation of trap properties of Hf 0.83 Zr 0.17 O 2 high- k gate stack p-type MOSFETs by low-frequency (1/ f ) noise and random telegraph noise analyses von Tsai, Shih-Chang, Wu, San-Lein, Huang, Po-Chin, Wang, Bo-Chin, Tsai, Kai-Shiang, Kao, Tsung-Hsien, Yang, Chih-Wei, Chen, Cheng-Guo, Cheng, Osbert, Fang, Yean-Kuen, Chang, Shoou-Jinn, Chen, Jone-Fang

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Investigation of trap properties of Hf sub(0.83)Zr sub(0.17)O sub(2) high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses von Tsai, Shih-Chang, Wu, San-Lein, Huang, Po-Chin, Wang, Bo-Chin, Tsai, Kai-Shiang, Kao, Tsung-Hsien, Yang, Chih-Wei, Chen, Cheng-Guo, Cheng, Osbert, Fang, Yean-Kuen, Chang, Shoou-Jinn, Chen, Jone-Fang

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