ULF-NMR system using HTS-SQUID and permanent magnet von Fukumoto, Shohei, Tsunaki, Shingo, Chigasaki, Takumi, Hatsukade, Yoshimi, Tanaka, Saburo

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ULF-NMR system using HTS-SQUID and permanent magnet von Fukumoto, Shohei, Tsunaki, Shingo, Chigasaki, Takumi, Hatsukade, Yoshimi, Tanaka, Saburo

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Feasibility study of contaminant detection for food with ULF-NMR/MRI system using HTS-SQUID von Hatsukade, Yoshimi, Tsunaki, Shingo, Yamamoto, Masaaki, Abe, Takayuki, Hatta, Junichi, Tanaka, Saburo

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Development of signal to noise ratio of HTS-rf-SQUID for ultra-low field NMR / MRI by 77K LC resonant circuit von Zhang, Dan, Fukumoto, Shohei, Tsunaki, Shingo, Hatsukade, Yoshimi, Tanaka, Saburo

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Ultra-low field NMR/MRI System using HTS-SQUID for food inspection von Yamamoto, Masaaki, Tsunaki, Shingo, Toyota, Hirotomo, Hatta, Jyuniti, Hatsukade, Yoshimi, Tanaka, saburo

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Study of Ultra-low Field NMR/MRI System using an LC Resonator von Toyota, Hirotomo, Yamamoto, Masaaki, Tsunaki, Shingo, Hatta, Junichi, Hatsukade, Yoshimi, Tanaka, Saburo

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LC共振器を用いた超低磁場NMR/MRIに関する研究 von 豊田, 裕智, 山本, 将彰, 綱木, 辰悟, 八田, 純一, 廿日出, 好, 田中, 三郎

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HTS-SQUIDを用いた超低磁場NMR/MRI装置の食品検査応用 von 山本, 将彰, 綱木, 辰悟, 豊田, 裕智, 八田, 純一, 廿日出, 好, 田中, 三郎

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Association Between Direct Oral Anticoagulant Score and Bleeding Events in Patients With Atrial Fibrillation Following Transcatheter Aortic Valve Replacement: A Retrospective Multi... von Harano, Yoshihiro, Yamamoto, Masanori, Shimura, Tetsuro, Okubo, Munenori, Koyama, Yutaka, Yamaguchi, Ryo, Kagase, Ai, Tokuda, Takahiro, Yashima, Fumiaki, Shirai, Shinichi, Tada, Norio, Naganuma, Toru, Yamawaki, Masahiro, Yamanaka, Futoshi, Mizutani, Kazuki, Noguchi, Masahiko, Ueno, Hiroshi, Takagi, Kensuke, Ohno, Yohei, Izumo, Masaki, Nishina, Hidetaka, Asami, Masahiko, Otsuka, Toshiaki, Watanabe, Yusuke, Hayashida, Kentaro

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Prognostic Value of Ventricular-Arterial Coupling After Transcatheter Aortic Valve Replacement on Midterm Clinical Outcomes von Yokoyama, Hiroaki, Yamanaka, Futoshi, Shishido, Koki, Ochiai, Tomoki, Yokota, Shohei, Moriyama, Noriaki, Watanabe, Yusuke, Shirai, Shinichi, Tada, Norio, Araki, Motoharu, Yashima, Fumiaki, Naganuma, Toru, Ueno, Hiroshi, Tabata, Minoru, Mizutani, Kazuki, Takagi, Kensuke, Yamamoto, Masanori, Saito, Shigeru, Hayashida, Kentaro

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Method of and apparatus for determining residual damage to wafer edges von KUDO, HIDEO, TSUNAKI, HIDETOSHI, MORIOKA, NORITAKA, SUMIE, SHINGO, MASUMURA, HISASHI, HIRAO, YUJI

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Method of and apparatus for determining residual damage to wafer edges von MASUMURA, HISASHI, HIRAO, YUJI, SUMIE, SHINGO, KUDO, HIDEO, MORIOKA, NORITAKA, TSUNAKI, HIDETOSHI

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REMAINING DAMAGE MEASURING METHOD OF WAFER EDGE PART AND ITS APPARATUS von MASUMURA HISASHI, TSUNAKI HIDETOSHI, MORIOKA AKITAKA, SUMINOE SHINGO, HIRAO YUJI, KUDO HIDEO

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Method of and apparatus for determining residual damage to wafer edges von KUDO, HIDEO, TSUNAKI, HIDETOSHI, MORIOKA, NORITAKA, SUMIE, SHINGO, MASUMURA, HISASHI, HIRAO, YUJI

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