Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions von Gupta, Viyas, Bosser, Alexandre, Tsiligiannis, Georgios, Zadeh, Ali, Javanainen, Arto, Virtanen, Ari, Puchner, Helmut, Saigne, Frederic, Wrobel, Frederic, Dilillo, Luigi

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A New Analytical Approach to Evaluate the Radiation Sensitivity of Circuits Implemented on SRAM-Based FPGAs von Bricas, Gaetan, Tsiligiannis, Georgios, Boch, Jerome, Bricas, Samuel

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FPGA Benchmarking Structures Dedicated to TID Parametric Degradation Evaluation von Bricas, Gaetan, Tsiligiannis, Georgios, Touboul, Antoine, Boch, Jerome, Maraine, Tadec, Saigne, Frederic

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On the evaluation of FPGA radiation benchmarks von Bricas, G., Tsiligiannis, G., Touboul, A., Boch, J., Kastriotou, M., Cazzaniga, C., Frost, C.D., Dilillo, L., Matana Luza, L.

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Multiple Cell Upset Classification in Commercial SRAMs von Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Puchner, H., Frost, C., Wrobel, F., Saigné, F.

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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory von Bosser, A. L., Gupta, V., Javanainen, A., Tsiligiannis, G., LaLumondiere, S. D., Brewe, D., Ferlet-Cavrois, V., Puchner, H., Kettunen, H., Gil, T., Wrobel, F., Saigne, F., Virtanen, A., Dilillo, L.

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Soft errors in commercial off-the-shelf static random access memories von Dilillo, L, Tsiligiannis, G, Gupta, V, Bosser, A, Saigne, F, Wrobel, F

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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs von Bosser, A., Gupta, V., Tsiligiannis, G., Javanainen, A., Kettunen, H., Puchner, H., Saigne, F., Virtanen, A., Wrobel, F., Dilillo, L.

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Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode von Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Todri, A., Virazel, A., McClure, S. S., Touboul, A. D., Wrobel, F., Saigne, F.

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Dynamic Test Methods for COTS SRAMs von Tsiligiannis, G., Dilillo, L., Gupta, V., Bosio, A., Girard, P., Virazel, A., Puchner, H., Bosser, A., Javanainen, A., Virtanen, A., Frost, C., Wrobel, F., Dusseau, L., Saigne, F.

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SEE on Different Layers of Stacked-SRAMs von Gupta, V., Bosser, A., Tsiligiannis, G., Rousselet, M., Mohammadzadeh, A., Javanainen, A., Virtanen, A., Puchner, H., Saigne, F., Wrobel, F., Dilillo, L.

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Mechanisms of Electron-Induced Single-Event Upsets in Medical and Experimental Linacs von Tali, Maris, Garcia Alia, Ruben, Brugger, Markus, Ferlet-Cavrois, Veronique, Corsini, Roberto, Farabolini, Wilfrid, Javanainen, Arto, Kastriotou, Maria, Kettunen, Heikki, Santin, Giovanni, Boatella Polo, Cesar, Tsiligiannis, Georgios, Danzeca, Salvatore, Virtanen, Ari

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An SRAM Based Monitor for Mixed-Field Radiation Environments von Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Mekki, J., Brugger, M., Wrobel, F., Saigné, F.

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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs von Bosser, Alexandre Louis, Gupta, Viyas, Tsiligiannis, Georgios, Javanainen, Arto, Kettunen, Heikki, Puchner, Helmut, Saigné, Frédéric, Virtanen, Ari, Wrobel, Frédéric, Dilillo, Luigi

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Soft Errors in Memory Devices : Novel Methods and Practices for Dynamic and Static Testing von Tsiligiannis, Georgios

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Methodologies for the Statistical Analysis of Memory Response to Radiation von Bosser, Alexandre L., Gupta, Viyas, Tsiligiannis, Georgios, Frost, Christopher D., Zadeh, Ali, Jaatinen, Jukka, Javanainen, Arto, Puchner, Helmut, Saigne, Frederic, Virtanen, Ari, Wrobel, Frederic, Dilillo, Luigi

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90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica von Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Virazel, A., Cocquerez, P., Autran, J. L., Litterio, A., Wrobel, F., Saigne, F.

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Evaluating a radiation monitor for mixed-field environments based on SRAM technology von Tsiligiannis, G, Dilillo, L, Bosio, A, Girard, P, Pravossoudovitch, S, Todri, A, Virazel, A, Mekki, J, Brugger, M, Wrobel, F, Saigne, F

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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell von Vatajelu, Elena I., Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Wrobel, F., Salgne, F.

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A Mixed Verification Strategy Tailored for Networks on Chip von Tsiligiannis, G., Pierre, L.

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