Aging Prediction and Tolerance for the SRAM Memory Cell and Sense Amplifier von Dounavi, Helen-Maria, Sfikas, Yiorgos, Tsiatouhas, Yiorgos

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A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVs von Gerakis, Vasileios, Tsiatouhas, Yiorgos, Hatzopoulos, Alkis

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Timing Error Tolerance in Small Core Designs for SoC Applications von Valadimas, Stefanos, Tsiatouhas, Yiorgos, Arapoyanni, Angela

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Layout-Based Refined NPSF Model for DRAM Characterization and Testing von Sfikas, Yiorgos, Tsiatouhas, Yiorgos E., Hamdioui, Said

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Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique von Arvaniti, Efi, Tsiatouhas, Yiorgos

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Radiation-hardened latch design with triple-node-upset recoverability von Paparsenos, Evangelos, Tsiatouhas, Yiorgos

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Effective Current Pre-Amplifiers for Visible Light Communication (VLC) Receivers von Poulis, Simon-Ilias, Papatheodorou, Georgios, Papaioannou, Christoforos, Sfikas, Yiorgos, Plissiti, Marina E., Efthymiou, Aristides, Liaperdos, John, Tsiatouhas, Yiorgos

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An aging monitoring scheme for SRAM decoders von Dounavi, Helen-Maria, Tsiatouhas, Yiorgos

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Testing Neighbouring Cell Leakage and Transition Induced Faults in DRAMs von Sfikas, Yiorgos, Tsiatouhas, Yiorgos

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Effective Timing Error Tolerance in Flip-Flop Based Core Designs von Valadimas, Stefanos, Tsiatouhas, Yiorgos, Arapoyanni, Angela, Xarchakos, Petros

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New High-Speed Multioutput Carry Look-Ahead Adders von Efstathiou, Costas, Owda, Zaher, Tsiatouhas, Yiorgos

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The Time Dilation Technique for Timing Error Tolerance von Valadimas, Stefanos, Floros, Andreas, Tsiatouhas, Yiorgos, Arapoyanni, Angela, Kavousianos, Xrysovalantis

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Adjustable RF Mixers' Alternate Test Efficiency Optimization by the Reduction of Test Observables von Liaperdos, John, Arapoyanni, Angela, Tsiatouhas, Yiorgos

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State reduction for efficient digital calibration of analog/RF integrated circuits von Liaperdos, John, Arapoyanni, Angela, Tsiatouhas, Yiorgos

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Static Power Reduction Using Variation-Tolerant and Reconfigurable Multi-Mode Power Switches von Zhaobo Zhang, Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu, Tsiatouhas, Yiorgos

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Built-In Self-Test, Diagnosis, and Repair of MultiMode Power Switches von Ran Wang, Zhaobo Zhang, Kavousianos, Xrysovalantis, Tsiatouhas, Yiorgos, Chakrabarty, Krishnendu

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A Built-In-Test Circuit for RF Differential Low Noise Amplifiers von Dermentzoglou, Lambros E, Arapoyanni, Angela, Tsiatouhas, Yiorgos

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A Built-In Voltage Measurement Technique for the Calibration of RF Mixers von Liaperdos, J., Arapoyanni, A., Tsiatouhas, Y.

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A test and calibration strategy for adjustable RF circuits von Liaperdos, John, Arapoyanni, Angela, Tsiatouhas, Yiorgos

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A current monitoring technique for IDDQ testing in digital integrated circuits von Matakias, Sotiris, Tsiatouhas, Yiorgos, Arapoyanni, Angela, Haniotakis, Themistoklis

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