Mis-Specification Analysis of Linear Degradation Models von Peng, Chien-Yu, Tseng, Sheng-Tsaing

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Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes von Sheng-Tsaing Tseng, Balakrishnan, N., Chih-Chun Tsai

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Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects von Chih-Chun Tsai, Sheng-Tsaing Tseng, Balakrishnan, N.

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Global planning of accelerated degradation tests based on exponential dispersion degradation models von Lee, I‐Chen, Tseng, Sheng‐Tsaing, Hong, Yili

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Optimal design for step-stress accelerated degradation tests von Liao, C.-M., Tseng, S.-T.

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Statistical Lifetime Inference With Skew-Wiener Linear Degradation Models von Chien-Yu Peng, Sheng-Tsaing Tseng

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Planning gamma accelerated degradation tests with two accelerating variables von Tung, Hung‐Ping, Tseng, Sheng‐Tsaing

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Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products von Peng, Chien-Yu, Tseng, Sheng-Tsaing

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Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process von Chih-Chun Tsai, Sheng-Tsaing Tseng, Balakrishnan, N

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Neural ordinary differential equation for sequential optimal design of fatigue test under accelerated life test analysis von Khakifirooz, Marzieh, Fathi, Michel, Lee, I-Chen, Tseng, Sheng-Tsaing

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Adaptive Warranty Prediction for Highly Reliable Products von Hsu, Nan-Jung, Tseng, Sheng-Tsaing, Chen, Ming-Wei

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Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation Models von Tseng, Sheng-Tsaing, Lee, I-Chen

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Fault Detection Based on Statistical Multivariate Analysis and Microarray Visualization von Ming-Da Ma, Wong, D.S.-H., Shi-Shang Jang, Sheng-Tsaing Tseng

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Analytical approach for designing accelerated degradation tests under an exponential dispersion model von Tung, Hung-Ping, Lee, I-Chen, Tseng, Sheng-Tsaing

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Mis-specification analyses of gamma and Wiener degradation processes von Tsai, Chih-Chun, Tseng, Sheng-Tsaing, Balakrishnan, N.

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Sequential Bayesian Design for Accelerated Life Tests von Lee, I-Chen, Hong, Yili, Tseng, Sheng-Tsaing, Dasgupta, Tirthankar

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Stability conditions and robustness analysis of a general MMSE run-to-run controller von Tseng, Sheng-Tsaing, Tsung, Fugee, Wu, Jo-Hua

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A generalized pH acceleration model of nano-sol products and the effects of model misspecification on shelf-life prediction von Tung, Hung-Ping, Tseng, Sheng-Tsaing, Hsu, Nan-Jung, Hou, Yi-Ting

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Determination of burn-in parameters and residual life for highly reliable products von Tseng, Sheng-Tsaing, Tang, Jen, Ku, In-Hong

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A Generalized Quasi-MMSE Controller for Run-to-Run Dynamic Models von Tseng, Sheng-Tsaing, Chen, Pei-Yu

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