Testing and diagnostics of CMOS circuits using light emission from off-state leakage current von Stellari, F., Peilin Song, Tsang, J.C., McManus, M.K., Ketchen, M.B.

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Electrically Induced Optical Emission from a Carbon Nanotube FET von Misewich, J. A., Martel, R., Ph. Avouris, Tsang, J. C., Heinze, S., Tersoff, J.

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High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements von Stellari, F., Zappa, F., Cova, S., Porta, C., Tsang, J.C.

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The Effect of Active Delay Element Resistance on Limiting Heavy Ion SEU Upset Cross-Sections of SOI ADE/SRAMs von Liu, S.T., Nelson, D.K., Tsang, J.C., Golke, K., Fechner, P., Heikkila, W., Brewster, N., Van Cleave, R., Liu, H.Y., McMarr, P.J., Hughes, H.L., Ziegler, J.F.

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Time-resolved optical characterization of electrical activity in integrated circuits von Tsang, J.C., Kash, J.A., Vallett, D.P.

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Heat inactivation of trypsin inhibitors in soymilk at ultra-high temperatures von Kwok, K.C, Qin, W.H, Tsang, J.C

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Dynamic internal testing of CMOS circuits using hot luminescence von Kash, J.A., Tsang, J.C.

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Secondary emission studies of hot carrier relaxation in polar semiconductors von Kash, J.A., Tsang, J.C.

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Enhanced raman scattering from carbon layers on silver von Tsang, J.C., Demuth, J.E., Sanda, P.N., Kirtley, J.R.

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Surface plasmon polariton contributions to strokes emission from molecular monolayers on periodic Ag surfaces von Tsang, J.C, Kirtley, J.R, Theis, T.N

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Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies von Tsang, J.C., Fischetti, M.V.

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How industry matters in balancing the federal research portfolio von Tsang, J.C.

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Light Scattering in Solids V: Superlattices and Other Microstructures von Cardona, Manuel, Güntherodt, Gernot

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Light Scattering in Solids VI: Recent Results, Including High-Tc Superconductivity von Cardona, Manuel, Cardona, M, Ehrenfreund, E, Güntherodt, Gernot, Güntherodt, G, Kash, J. A, Osten, W. von der, Page, J. B, Ramdas, A. K, Rodriguez, S

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Watching chips work: picosecond hot electron light emission from integrated circuits von Kash, J.A, Tsang, J.C

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Light emission during direct and Fowler-Nordheim tunneling in ultra thin MOS tunnel junctions von Cartier, E., Tsang, J.C., Fischetti, M.V., Buchanan, D.A.

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Backside optical emission diagnostics for excess I/sub DDQ von Kash, J.A., Tsang, J.C., Rizzolo, R.F., Patel, A.K., Shore, A.D.

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Electrolysis method of intercalation of layered transition metal dichalcogenides von Rao, G.V.Subba, Tsang, J.C.

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Effect of charge density wave fluctuations on the frequencies of optic phonons in 2H-TaSe2 and -NbSe2 von Tsang, J.C., Smith, J.E., Shafer, M.W.

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PICA: Backside failure analysis of CMOS circuits using Picosecond Imaging Circuit Analysis von Mc Manus, M.K., Kash, J.A., Steen, S.E., Polonsky, S., Tsang, J.C., Knebel, D.R., Huott, W.

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